NIST logo

Publications Portal

You searched on:
Author: robert vest
Sorted by: title

Displaying records 31 to 40 of 66 records.
Resort by: Date / Title


31. Measuring Pulse Energy With Solid-State Photodiodes
Published: 4/10/2009
Authors: Robert Edward Vest, Shannon Bradley Hill, Steven E Grantham
Abstract: With the advent of extreme ultraviolet lithography (EUVL) the measurement of the energy contained in pulses of short-wavelength radiation is becoming increasingly important. Even low average power sources can deliver pulses of radiation with high pea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840222

32. Metrology for EUV Lithography Sources and Tools
Published: 7/3/2006
Authors: Steven E Grantham, Charles S Tarrio, Robert Edward Vest, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840201

33. Metrology for EUVL Sources and Tools,ed. by V. Bakshi
Published: 1/1/2006
Authors: S Grantham, Charles S Tarrio, Robert Edward Vest, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100158

34. NIST Programs for Calibrations in the Far Ultraviolet Spectral Region
Published: 11/1/1999
Authors: Robert Edward Vest, L R Canfield, Mitchell L. Furst, R M Graves, A D Hamilton, L R Hughey, Thomas B Lucatorto, R P. Madden
Abstract: The National Institute of Standards and Technology (NIST) serves the growing ultraviolet user community by providing calibration services throughout the spectral range from 2 nm to 400 nm. In this paper we describe the far ultraviolet transfer standa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840081

35. NIST VUV Metrology Programs to Support Space Based Research,
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven E Grantham, Charles S Tarrio, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101784

36. NIST VUV metrology programs to support space-based research
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven E Grantham, Charles S Tarrio, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104243

37. Near UV Electroreflectance Facility
Published: 1/1/1997
Author: Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100274

38. Near UV Electroreflectance Facility
Published: 1/1/1997
Author: Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101862

39. New Developments for the Extreme Ultraviolet Detector Radiometry Beamline at SURF III
Published: 10/1/2000
Authors: Robert Edward Vest, L R Canfield
Abstract: The upgrade of the SURF electron storage ring has provided an opportunity to make several improvements to the detector radiometry beamline (BL-9). A new control and data acquisition system has been developed and new high-order-suppression filters hav ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840095

40. Noble Gas Excimer Scintillation Following Neutron Capture in Boron Thin Films
Published: 4/11/2014
Authors: Alan K Thompson, Jacob McComb, Charles W Clark, Michael A. Coplan, Mohamad Al-Sheikhly, Robert Edward Vest
Abstract: Far-ultraviolet (FUV) scintillation signals have been measured in heavy noble gases (argon, krypton, xenon) following boron-neutron capture (10B(n,α)7Li) in 10B thin films. The observed scintillation yields are comparable to the yields from some ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915257



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series