NIST logo

Publications Portal

You searched on: Author: robert vest

Displaying records 41 to 50 of 67 records.
Resort by: Date / Title


41. Response of a silicon photodiode to pulsed radiation,
Published: 1/1/2003
Authors: Robert Edward Vest, Steven E Grantham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101786

42. Towards high accuracy reflectometry for extreme-ultraviolet lithography,
Published: 1/1/2003
Authors: Charles S Tarrio, Steven E Grantham, M B Squires, Robert Edward Vest, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101861

43. Absolute Extreme Ultraviolet Metrology
Published: 8/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, S Grantham
Abstract: NIST has a long-standing program for the calibration of extreme ultraviolet optical components. Begun with the advent of the Synchrotron Ultraviolet Radiation Facility (SURF) almost 40 years ago, early activities centered on the development and char ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840110

44. AlGaN Schottky Diodes for Short-Wavelength UV Applications
Published: 6/1/2001
Authors: P P Chow, J J Klaassen, Robert Edward Vest, J M VanHove, A Wowchak, C Polley
Abstract: High performance ultraviolet (UV) detectors have been fabricated using plasma-enhanced molecular beam epitaxy (MBE). The realized AlGaN Schottky detectors exhibit high responsivity, sharp spectral cutoff and high shunt resistance of several giga-ohn ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840131

45. The New Ultraviolet Spectral Responsivity Scale Based on Cryogenic Radiometry at Synchrotron Ultraviolet Radiation Facility III
Published: 5/1/2001
Authors: Ping-Shine Shaw, Thomas C Larason, R Gupta, Steven W Brown, Robert Edward Vest, Keith R Lykke
Abstract: The recently completed upgrade of the Synchrotron Ultraviolet Radiation Facility (SURF III) at the National Institute of Standards and Technology (NIST) has improved the accuracy of radiometric measurements over a broad spectral range from the infrar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841478

46. Absolute EUV Metrology,
Published: 1/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, S Grantham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100203

47. Extreme Ultraviolet Metrology at SURF III
Published: 1/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, S Grantham, Thomas B Lucatorto
Abstract: The last two decades have seen the development normal-incidence multiplayer mirrors and semiconductor photodiodes for extreme ultraviolet (EUV) radiation. Applications such as in astrophysics, lithography, and plasma physics, require precise calibra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840120

48. Extreme-Ultraviolet Metrology at SURF III,
Published: 1/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, Steven E Grantham, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101762

49. New Developments for the Extreme Ultraviolet Detector Radiometry Beamline at SURF III
Published: 10/1/2000
Authors: Robert Edward Vest, L R Canfield
Abstract: The upgrade of the SURF electron storage ring has provided an opportunity to make several improvements to the detector radiometry beamline (BL-9). A new control and data acquisition system has been developed and new high-order-suppression filters hav ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840095

50. NIST Programs for Calibrations in the Far Ultraviolet Spectral Region
Published: 11/1/1999
Authors: Robert Edward Vest, L R Canfield, Mitchell L. Furst, R M Graves, A D Hamilton, L R Hughey, Thomas B Lucatorto, R P. Madden
Abstract: The National Institute of Standards and Technology (NIST) serves the growing ultraviolet user community by providing calibration services throughout the spectral range from 2 nm to 400 nm. In this paper we describe the far ultraviolet transfer standa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840081



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series