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Author: charles tarrio
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Displaying records 61 to 70 of 102 records.
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61. Microtomography of an integrated circuit interconnect with an electromigration void
Published: 1/1/2000
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Ying-ju Wang, Uwe Arp, Thomas B Lucatorto, B D Ravel, Charles S Tarrio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101604

62. Smoothing of Mirror Substrates by Thin-Film Deposition
Published: 9/8/1999
Authors: E Spiller, S Baker, E Parra, Charles S Tarrio
Abstract: Superpolished optical flats with high spatial frequency roughness below 0.1 nm have been commercially available for years. However, it is much more difficult to obtain figured optics of similar quality. We have obtained and tested the finish of fig ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840071

63. Methods to Remove Distortion Artifacts in Scanned Projections
Published: 7/1/1999
Authors: A R Kalukin, Zachary H Levine, Charles S Tarrio, S P Frigo, I McNulty, S S Wang, C C Retsch, M Kuhn, B Winn
Abstract: Atrifacts induced by distortions which sometimes occur in two-dimensional projection images can appear in the resulting tomographic reconstructions. We describe a procedure for analyzing, correcting and removing experimental atrifacts, and hence redu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840077

64. Instrumental Aspects of X-Ray Microbeams in the Range Above 1 keV
Published: 4/1/1999
Authors: P Dhez, P Chevallier, Thomas B Lucatorto, Charles S Tarrio
Abstract: X rays were discovered by Roentgen in 1895, just over 100 years ago. Early investigations by Roentgen himself indicated that prisms, lenses, and mirrors were seemingly ineffective for deflecting and focusing x rays. However, the magical ability to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840051

65. Instrumental Aspects of X-Ray Microbeams in the Range Above 1 KeV
Published: 1/1/1999
Authors: P Dhez, P Chevallier, Thomas B Lucatorto, Charles S Tarrio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101503

66. Optical Constants of In-Situ-Deposited Films of Important Extreme-Ultraviolet Multilayer Mirror Materials
Published: 7/1/1998
Authors: Charles S Tarrio, R N. Watts, Thomas B Lucatorto, J M Slaughter, Charles M Falco
Abstract: We have performed angle-dependent reflectance measurements of in-situ magnetron sputtered films of B^d4^C, C, Mo, Si, and W. The Fresnel relations were used to determine the complex index of refraction from the reflectance data in the region of appro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840047

67. Photon Physics Home Page
Published: 5/1/1998
Authors: Uwe Arp, Charles S Tarrio
Abstract: The principal research activities of the Photon Physics Group are in the far ultraviolet and extreme ultraviolet [EUV] physics. In particular, we are currently pursing research activities in EUV optics, the development of x-ray microscopies, and nan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840048

68. First Solar EUV Irradiances Obtained from SOHO by the SEM,
Published: 1/1/1998
Authors: D L Judge, D R McMullin, H S Ogawa, D Hovestadt, B Klecker, M Hilchenbach, E M{omlat}bius, L R Canfield, Robert Edward Vest, R N. Watts, Charles S Tarrio, M K{umlat}hne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101579

69. Optical Constants of In-Situ Deposited Films of Important EUV Multilayer Materials,
Published: 1/1/1998
Authors: Charles S Tarrio, R N. Watts, Thomas B Lucatorto, J M Slaughter, C M Falco
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101763

70. An Evaluation of Multilayer Mirrors for the Soft X-Ray and Extreme Ultraviolet Wavelength Range That Were Irradiated With Neutrons,
Published: 1/1/1997
Authors: S P Regan, M J May, V Soukhanovskii, M Finkenthal, H W Moos, E H Farnum, F W Clinard, Charles S Tarrio, R N. Watts
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101682



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