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Author: ping-shine shaw
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Displaying records 11 to 20 of 65 records.
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11. Absolute radiant flux measurement for the angular distribution of synchrotron radiation
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104163

12. Absolute radiant flux measurement of the angular distribution of synchrotron radiation,
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101711

13. NIST VUV Metrology Programs to Support Space Based Research,
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven E Grantham, Charles S Tarrio, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101784

14. NIST VUV metrology programs to support space-based research
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven E Grantham, Charles S Tarrio, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104243

15. UV and VUV radiometry programs at the Synchrotron Ultraviolet Radiation Facility (SURF III)
Published: 1/1/2006
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103972

16. Damage to Solid-State Photodiodes by Vacuum Ultraviolet Radiation
Published: 6/1/2005
Authors: Uwe Arp, Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We report experimental results on the stability of photodiodes obtained at three different wavelengths in the vacuum ultraviolet spectral region. Two of these experiments were based on radiation damage inflicted with excimer lasers at 193 nm and 157 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840194

17. Damage to solid-state photodiodes by vacuum ultraviolet radiation
Published: 1/1/2005
Authors: Uwe Arp, R Gupta, L R Lykke, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100986

18. Stability of Photodiodes Under Irradiation With 157-nm Pulsed Excimer Laser
Published: 1/1/2005
Authors: Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We have measured the stability of a variety of photodiodes as they are irradiated with UV light from a pulsed excimer laser source operating at 157 nm using a radiometry beamline at the Synchrotron Ultraviolet Radiation Facility (SURF III) at the Nat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841808

19. Stability of photodiodes under irradiation with 157 nm pulsed excimer laser
Published: 1/1/2005
Authors: R Gupta, L R Lykke, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103831

20. Improved Radiometry For Extreme-Ultraviolet Lithography
Published: 11/1/2004
Authors: Charles S Tarrio, Robert Edward Vest, Steven E Grantham, K Liu, Thomas B Lucatorto, Ping-Shine Shaw
Abstract: The absolute cryogenic radiometer (ACR), an electrical-substitution-based detector, is the most accurate method for measurement of radiant power in the extreme ultraviolet. At the National Institute of Standards and Technology, ACR-based measurements ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840173



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