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You searched on: Author: david seiler Sorted by: title

Displaying records 61 to 70 of 75 records.
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61. RII Spectroscopy of Trap Levels in Bulk and LPE Hg^d1-x^CdxTe
Published: 12/31/1993
Authors: Chris L. Littler, X. N. Song, Z. Yu, J. L. Elkind, J R. Lowney, David G Seiler

62. Scanning Capacitance Microscopy for Profiling PN-Junctions in Silicon
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/1/1994
Authors: Joseph J Kopanski, Jay F. Marchiando, J R. Lowney, David G Seiler

63. Semiconductor Characterization: Present Status and Future Needs
Published: 1/3/1996
Authors: W M Bullis, David G Seiler, A C Diebold

64. Semiconductor Electronics Division
Series: NIST Interagency/Internal Report (NISTIR)
Published: 9/30/2003
Authors: David G Seiler, Erik M Secula
Abstract: This is a high-level, full-color brochure detailing the activities and challenges of the Semiconductor Electronics Division. Topics include Division history, nanotechnology, MEMS, electrical test structures, power electronics, optical and electrical ...

65. Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites
Series: Special Publication (NIST SP)
Published: 4/1/1994
Authors: David G Seiler, J R. Lowney, W. Robert Thurber, Joseph J Kopanski, George Gibson Harman

66. Semiconductor Measurement Technology: Survey of Optical Characterization Methods for Materials, Processing, and Manufacturing in the Semiconductor Industry
Series: Special Publication (NIST SP)
Published: 12/1/1995
Authors: W M Bullis, S. Perkowitz, David G Seiler

67. Shubnikov-de Haas Measurements on n-Type and p-Type HgTe-CdTe Superlattices
Published: 7/1/1989
Authors: David G Seiler, G. B. Ward, R. J. Justice, R. J. Koestner, M. W. Goodwin, M. A. Kinch, J. R. Meyer

68. Special Section on the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Published: 11/1/2006
Author: David G Seiler
Abstract: Since 1995, the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly titled "Characterization and Metrology for ULSI Technology") has provided a forum for the characterization and metrology community t ...

69. Temperature and Composition Dependence of the Energy Gap of Hg^d1-x^Cd^dx^Te by Two-Photon Magnetoabsorption Techniques
Published: 3/29/1990
Authors: David G Seiler, J R. Lowney, Chris L. Littler, M. R. Loloee

70. The MEMS 5-in-1 Reference Materials (RM 8096 and 8097)
Published: 3/21/2012
Authors: Janet M Cassard, Jon C Geist, Michael Gaitan, David G Seiler
Abstract: The MEMS 5-in-1 Reference Material (RM) contains test structures for five standard test methods on one test chip, so companies can compare their in-house measurements taken on the RM with NIST measurements, thereby validating their use of the documen ...

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series