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Displaying records 61 to 70 of 73 records.
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61. Semiconductor Characterization: Present Status and Future Needs
Published: 1/3/1996
Authors: W M Bullis, David G Seiler, A C Diebold
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908415

62. Semiconductor Electronics Division
Series: NIST Interagency/Internal Report (NISTIR)
Published: 9/30/2003
Authors: David G Seiler, Erik M Secula
Abstract: This is a high-level, full-color brochure detailing the activities and challenges of the Semiconductor Electronics Division. Topics include Division history, nanotechnology, MEMS, electrical test structures, power electronics, optical and electrical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31371

63. Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites
Series: Special Publication (NIST SP)
Published: 4/1/1994
Authors: David G Seiler, J R. Lowney, W. Robert Thurber, Joseph J Kopanski, George Gibson Harman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13439

64. Semiconductor Measurement Technology: Survey of Optical Characterization Methods for Materials, Processing, and Manufacturing in the Semiconductor Industry
Series: Special Publication (NIST SP)
Published: 12/1/1995
Authors: W M Bullis, S. Perkowitz, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14829

65. Shubnikov-de Haas Measurements on n-Type and p-Type HgTe-CdTe Superlattices
Published: 7/1/1989
Authors: David G Seiler, G. B. Ward, R. J. Justice, R. J. Koestner, M. W. Goodwin, M. A. Kinch, J. R. Meyer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6165

66. Special Section on the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Published: 11/1/2006
Author: David G Seiler
Abstract: Since 1995, the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly titled "Characterization and Metrology for ULSI Technology") has provided a forum for the characterization and metrology community t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32443

67. Temperature and Composition Dependence of the Energy Gap of Hg^d1-x^Cd^dx^Te by Two-Photon Magnetoabsorption Techniques
Published: 3/29/1990
Authors: David G Seiler, J R. Lowney, Chris L. Littler, M. R. Loloee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14738

68. The MEMS 5-in-1 Reference Materials (RM 8096 and 8097)
Published: 3/21/2012
Authors: Janet M Cassard, Jon C Geist, Michael Gaitan, David G Seiler
Abstract: The MEMS 5-in-1 Reference Material (RM) contains test structures for five standard test methods on one test chip, so companies can compare their in-house measurements taken on the RM with NIST measurements, thereby validating their use of the documen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910317

69. The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)
Published: 3/27/2013
Authors: Janet M Cassard, Jon C Geist, Craig Dyer McGray, Richard A Allen, Muhammad Yaqub Afridi, Brian Joseph Nablo, Michael Gaitan, David G Seiler
Abstract: This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures from which material and dimensional properties are obtained using five documentary standard ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912229

70. The Shubnikov-de Haas Effect in Semiconductors: A Comprehensive Review of Experimental Aspects
Published: 12/31/1991
Authors: David G Seiler, A. E. Stephens
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23546



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