NIST logo

Publications Portal

You searched on:
Author: david seiler
Sorted by: title

Displaying records 31 to 40 of 73 records.
Resort by: Date / Title


31. High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride
Published: 8/1/1992
Authors: Joseph J Kopanski, J R. Lowney, Donald B. Novotny, David G Seiler, A. Simmons, J. Ramsey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12351

32. High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride
Published: 12/31/1991
Authors: Joseph J Kopanski, J R. Lowney, Donald B. Novotny, David G Seiler, A. Simmons, J. Ramsey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14956

33. Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry
Published: 6/1/1993
Authors: Nhan V Nguyen, Joseph G. Pellegrino, Paul M. Amirtharaj, David G Seiler, S. B. Qadri
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27953

34. International Conference on Narrow-Gap Semiconductors and Related Materials
Series: Journal of Research (NIST JRES)
Published: 8/1/1990
Authors: David G Seiler, Chris L. Littler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5694

35. International Workshop on Semiconductor Characterization: Present Status and Future Needs
Series: Journal of Research (NIST JRES)
Published: 11/1/1995
Authors: David G Seiler, Thomas J. Shaffner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27247

36. Intrinsic Carrier Concentration of Narrow-Gap Mercury Cadmium Telluride Based on the Nonlinear Temperature Dependence of the Bandgap
Published: 2/1/1992
Authors: J R. Lowney, David G Seiler, Chris L. Littler, I. T. Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28720

37. Intrinsic Carrier Concentrations in Long Wavelength HgCdTe Based on the New, Nonlinear Temperature Dependence of Eg(x,T)
Published: 12/31/1991
Authors: David G Seiler, J R. Lowney, Chris L. Littler, I. T. Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22086

38. Investigation of Mercury Interstitials in Hg^d1-2^CdxTe Alloys Using Resonant Impact-Ionization Spectroscopy
Published: 8/1/1992
Authors: Chris L. Littler, E. Maldonado, X. N. Song, Z. Yu, J. L. Elkind, David G Seiler, J R. Lowney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28883

39. Magneto-Optical Investigation of Impurity and Defect Levels in HgCdTe Alloys
Published: 3/30/1990
Authors: Chris L. Littler, David G Seiler, M. R. Loloee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27298

40. Magneto-Transport Properties of HgCdTe, EMIS Data Reviews
Published: 12/31/1994
Authors: J R. Lowney, Jin S. Kim, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4207



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series