NIST logo

Publications Portal

You searched on:
Author: david seiler
Sorted by: title

Displaying records 21 to 30 of 73 records.
Resort by: Date / Title


21. Frontiers of Analytical Metrology for the Silicon Semiconductor Industry
Published: 2/1/2001
Authors: Thomas J. Shaffner, David G Seiler
Abstract: The grand challenges of the National Technology Roadmap for Semiconductors include affordable scaling, new materials and structures, and yield and reliability. While these encapsulate the high-level perspective and needs of the industry as a whole, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18732

22. Frontiers of Characterization and Metrology for Nanoelectronics: 2009
Published: 10/5/2009
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904357

23. Frontiers of Characterization and Metrology for Nanoelectronics: 2007
Published: 9/30/2007
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, C M Garner, Dan Herr, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32757

24. Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Published: 12/28/2011
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910545

25. Frontiers of Characterization and Metrology for Nanoelectronics: 2013
Published: 3/26/2013
Authors: Erik M Secula, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913713

26. Government Jobs for Physicists: Believe It or Not Challenging and Satisfying!
Published: 5/30/2006
Author: David G Seiler
Abstract: This presentation details the benefits of government positions for physicists based on the experiences of a NIST Division Chief.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32273

27. Heavily Accumulated Surfaces of Mercury Cadmium Telluride Detectors: Theory and Experiment
Published: 7/1/1993
Authors: J R. Lowney, David G Seiler, W. Robert Thurber, Z. Yu, X. N. Song, Chris L. Littler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25707

28. Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs
Published: 12/31/1993
Authors: David G Seiler, Santos D Mayo, J R. Lowney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12130

29. HgCdTe Detector Reliability Study for the GOES Program
Series: NIST Interagency/Internal Report (NISTIR)
Published: 9/30/1991
Authors: David G Seiler, George Gibson Harman, J R. Lowney, Santos D Mayo, W S Liggett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11016

30. High Excited States of Magnetodonors in InSb: An Experimental and Theoretical Study
Published: 9/15/1990
Authors: W. Zawadzki, X. N. Song, Chris L. Littler, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=864



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series