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Author: david seiler
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Displaying records 11 to 20 of 73 records.
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11. Characterization of Two-Dimensional Dopant Profiles: Status and Review
Published: 2/1/1996
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28378

12. Characterization of Two-Dimensional Dopant Profiles: Status and Review, Extended Abstracts
Published: 12/31/1994
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1068

13. Determination of Densities and Mobilities of Heavy and Light Holes in P-Type Si Using Reduced-Conductivity-Tensor Analyses of Magnetic-Field Dependent Hall and Resistivity Measurements
Published: 12/31/1996
Authors: Jin S. Kim, David G Seiler, James R. Ehrstein
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25755

14. Do We Need a Roadmap?
Published: 4/1/1999
Authors: Herbert S Bennett, Joseph G. Pellegrino, D. L. Rode, Thomas J. Shaffner, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19552

15. Donor-Shifted Phonon-Assisted Magneto-Optical Resonances in n-InSb
Published: 12/25/1989
Authors: Chris L. Littler, W. Zawadzki, M. R. Loloee, X. N. Song, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2507

16. Electrical Characterization of Liquid-Phase Epitaxially Grown Single-Crystal Films of Mercury Cadmium Telluride by Variable-Magnetic-Field Hall Measurements
Published: 12/31/1994
Authors: Jin S. Kim, David G Seiler, Luigi Colombo, M. C. Chen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13049

17. Electrical Characterization of Narrow Gap n-Type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced Conductivity-Tensor Analyses
Published: 12/31/1994
Authors: Jin S. Kim, David G Seiler, R. A. Lancaster, M. B. Reine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14122

18. Electrical Characterization of Narrow Gap n-type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced-Conductivity-Tensor Analyses
Published: 12/31/1995
Authors: Jin S. Kim, David G Seiler, R. A. Lancaster, M. B. Reine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13171

19. Electrical Characterization of Very-Narrow-Gap Bulk HgCdTe Single Crystals by Variable Magnetic-Field-Hall Measurements
Published: 12/31/1996
Authors: Jin S. Kim, David G Seiler, R. A. Lancaster, M. B. Reine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28525

20. Extending CMOS Measurements to the Nanoscale
Published: 3/7/2006
Author: David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32200



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