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Displaying records 1 to 10 of 75 records.
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1. Advanced Experimental Methods for Low-Temperature Magnetotransport Measurement of Novel Materials
Published: 1/21/2016
Authors: Joseph A Hagmann, Son Truong Le, Curt A Richter, David G Seiler
Abstract: Novel electronic materials are often produced for the first time by synthesis processes that yield bulk crystals (in contrast to single crystal thin film synthesis) for the purpose of exploratory materials research. Certain materials pose a chall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918445

2. Bound Hole Excitations in p-Hg^d0.76^Cd^d0.24^Te
Published: 12/31/1990
Authors: Chris L. Littler, M. R. Loloee, W. Zawadzki, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11644

3. Business and Manufacturing Motivations for the Development of Analytical Technology and Metrology for Semiconductors
Published: 12/31/1995
Authors: Thomas J. Shaffner, Alain C. Diebold, R. C. McDonald, David G Seiler, W M Bullis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25370

4. Challenges of Metrology and Characterization Measurements for ULSI Technology
Published: 1/1/2001
Authors: David G Seiler, Thomas J. Shaffner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30333

5. Characterization and Metrology for ULSI Technology
Published: 11/1/1998
Authors: David G Seiler, Alain C. Diebold, W M Bullis, Thomas J. Shaffner, R. C. McDonald, E. J. Walters
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1561

6. Characterization and Metrology for ULSI Technology: 2000
Published: 2/1/2001
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, R. C. McDonald, W M Bullis, P. J. Smith, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11480

7. Characterization and Metrology for ULSI Technology: 2003
Published: 9/30/2003
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, Stefan Zollner, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31463

8. Characterization and Metrology for ULSI Technology: 2005
Published: 9/28/2005
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Caroline Ayre, Rajinder P. Khosla, Stefan Zollner, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32093

9. Characterization of LPE HgCdTe Films by Magnetoresistance
Published: 12/31/1994
Authors: Jin Soon Kim, David G Seiler, Luigi Colombo
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21841

10. Characterization of Liquid-Phase Epitaxially Grown HgCdTe Films by Magnetoresistance Measurements
Published: 9/1/1995
Authors: Jin Soon Kim, David G Seiler, Luigi Colombo, M. C. Chen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27811



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