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You searched on: Author: david seiler Sorted by: date

Displaying records 41 to 50 of 74 records.
Resort by: Date / Title

41. Characterization of LPE HgCdTe Films by Magnetoresistance
Published: 12/31/1994
Authors: Jin Soon Kim, David G Seiler, Luigi Colombo

42. Characterization of Two-Dimensional Dopant Profiles: Status and Review, Extended Abstracts
Published: 12/31/1994
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler

43. Electrical Characterization of Liquid-Phase Epitaxially Grown Single-Crystal Films of Mercury Cadmium Telluride by Variable-Magnetic-Field Hall Measurements
Published: 12/31/1994
Authors: Jin Soon Kim, David G Seiler, Luigi Colombo, M. C. Chen

44. Electrical Characterization of Narrow Gap n-Type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced Conductivity-Tensor Analyses
Published: 12/31/1994
Authors: Jin Soon Kim, David G Seiler, R. A. Lancaster, M. B. Reine

45. Magneto-Transport Properties of HgCdTe, EMIS Data Reviews
Published: 12/31/1994
Authors: J R. Lowney, Jin Soon Kim, David G Seiler

46. Optical Properties of Semiconductors
Published: 12/31/1994
Authors: Paul M. Amirtharaj, David G Seiler

47. Scanning Capacitance Microscopy for Profiling PN-Junctions in Silicon
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/1/1994
Authors: Joseph J Kopanski, Jay F. Marchiando, J R. Lowney, David G Seiler

48. Optical Characterization in Microelectronics Manufacturing
Published: 9/1/1994
Authors: S. Perkowitz, David G Seiler

49. Optical Characterization in Microelectronics Manufacturing
Series: Journal of Research (NIST JRES)
Published: 9/1/1994
Authors: S. Perkowitz, David G Seiler, William Duncan

50. Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer
Published: 5/30/1994
Authors: J R. Lowney, W. Robert Thurber, David G Seiler

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