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Author: david seiler
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31. Business and Manufacturing Motivations for the Development of Analytical Technology and Metrology for Semiconductors
Published: 12/31/1995
Authors: Thomas J. Shaffner, Alain C. Diebold, R. C. McDonald, David G Seiler, W M Bullis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25370

32. Characterization of Two-Dimensional Dopant Profiles: Status and Review
Published: 12/31/1995
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24280

33. Electrical Characterization of Narrow Gap n-type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced-Conductivity-Tensor Analyses
Published: 12/31/1995
Authors: Jin S. Kim, David G Seiler, R. A. Lancaster, M. B. Reine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13171

34. Mesoscopic Conductance Fluctuations in Large Devices
Published: 12/31/1995
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23051

35. Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices
Published: 12/31/1995
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino, W. F. Tseng, W. Robert Thurber
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2579

36. Optical Characterization of Materials and Devices for the Semiconductor Industry: Trends and Needs
Published: 12/31/1995
Authors: S. Perkowitz, David G Seiler, W M Bullis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9057

37. Semiconductor Measurement Technology: Survey of Optical Characterization Methods for Materials, Processing, and Manufacturing in the Semiconductor Industry
Series: Special Publication (NIST SP)
Published: 12/1/1995
Authors: W M Bullis, S. Perkowitz, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14829

38. International Workshop on Semiconductor Characterization: Present Status and Future Needs
Series: Journal of Research (NIST JRES)
Published: 11/1/1995
Authors: David G Seiler, Thomas J. Shaffner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27247

39. Characterization of Liquid-Phase Epitaxially Grown HgCdTe Films by Magnetoresistance Measurements
Published: 9/1/1995
Authors: Jin S. Kim, David G Seiler, Luigi Colombo, M. C. Chen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27811

40. Characterization of LPE HgCdTe Films by Magnetoresistance
Published: 12/31/1994
Authors: Jin S. Kim, David G Seiler, Luigi Colombo
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21841