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You searched on: Author: david seiler Sorted by: date

Displaying records 21 to 30 of 75 records.
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21. Semiconductor Electronics Division
Series: NIST Interagency/Internal Report (NISTIR)
Published: 9/30/2003
Authors: David G Seiler, Erik M Secula
Abstract: This is a high-level, full-color brochure detailing the activities and challenges of the Semiconductor Electronics Division. Topics include Division history, nanotechnology, MEMS, electrical test structures, power electronics, optical and electrical ...

22. Characterization and Metrology for ULSI Technology: 2000
Published: 2/1/2001
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, R. C. McDonald, W M Bullis, P. J. Smith, Erik M Secula

23. Frontiers of Analytical Metrology for the Silicon Semiconductor Industry
Published: 2/1/2001
Authors: Thomas J. Shaffner, David G Seiler
Abstract: The grand challenges of the National Technology Roadmap for Semiconductors include affordable scaling, new materials and structures, and yield and reliability. While these encapsulate the high-level perspective and needs of the industry as a whole, ...

24. Challenges of Metrology and Characterization Measurements for ULSI Technology
Published: 1/1/2001
Authors: David G Seiler, Thomas J. Shaffner

25. Do We Need a Roadmap?
Published: 4/1/1999
Authors: Herbert S Bennett, Joseph G. Pellegrino, D. L. Rode, Thomas J. Shaffner, David G Seiler

26. Characterization and Metrology for ULSI Technology
Published: 11/1/1998
Authors: David G Seiler, Alain C. Diebold, W M Bullis, Thomas J. Shaffner, R. C. McDonald, E. J. Walters

27. Proceedings of the Fourth International Conference on Materials and Process Characterization for VLSI
Published: 12/1/1997
Authors: X. F. Zong, David G Seiler, L. G. Song

28. Determination of Densities and Mobilities of Heavy and Light Holes in P-Type Si Using Reduced-Conductivity-Tensor Analyses of Magnetic-Field Dependent Hall and Resistivity Measurements
Published: 12/31/1996
Authors: Jin Soon Kim, David G Seiler, James R. Ehrstein

29. Electrical Characterization of Very-Narrow-Gap Bulk HgCdTe Single Crystals by Variable Magnetic-Field-Hall Measurements
Published: 12/31/1996
Authors: Jin Soon Kim, David G Seiler, R. A. Lancaster, M. B. Reine

30. Quantum Conductance Fluctuations in a New Size-Scale Regime
Published: 5/5/1996
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
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  • SP 823-XX: Integrated Services Digital Network Series