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Author: david seiler

Displaying records 41 to 50 of 73 records.
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41. Characterization of Two-Dimensional Dopant Profiles: Status and Review, Extended Abstracts
Published: 12/31/1994
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1068

42. Electrical Characterization of Liquid-Phase Epitaxially Grown Single-Crystal Films of Mercury Cadmium Telluride by Variable-Magnetic-Field Hall Measurements
Published: 12/31/1994
Authors: Jin S. Kim, David G Seiler, Luigi Colombo, M. C. Chen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13049

43. Electrical Characterization of Narrow Gap n-Type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced Conductivity-Tensor Analyses
Published: 12/31/1994
Authors: Jin S. Kim, David G Seiler, R. A. Lancaster, M. B. Reine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14122

44. Magneto-Transport Properties of HgCdTe, EMIS Data Reviews
Published: 12/31/1994
Authors: J R. Lowney, Jin S. Kim, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4207

45. Optical Properties of Semiconductors
Published: 12/31/1994
Authors: Paul M. Amirtharaj, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29761

46. Scanning Capacitance Microscopy for Profiling PN-Junctions in Silicon
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/1/1994
Authors: Joseph J Kopanski, Jay F. Marchiando, J R. Lowney, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27180

47. Optical Characterization in Microelectronics Manufacturing
Published: 9/1/1994
Authors: S. Perkowitz, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32631

48. Optical Characterization in Microelectronics Manufacturing
Series: Journal of Research (NIST JRES)
Published: 9/1/1994
Authors: S. Perkowitz, David G Seiler, William Duncan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5728

49. Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer
Published: 5/30/1994
Authors: J R. Lowney, W. Robert Thurber, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23796

50. Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites
Series: Special Publication (NIST SP)
Published: 4/1/1994
Authors: David G Seiler, J R. Lowney, W. Robert Thurber, Joseph J Kopanski, George Gibson Harman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13439



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