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Author: david seiler

Displaying records 11 to 20 of 73 records.
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11. Frontiers of Characterization and Metrology for Nanoelectronics: 2007
Published: 9/30/2007
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, C M Garner, Dan Herr, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32757

12. Metrology in the Nanoelectronics Era: Collaborative Innovation Between NIST and Industry
Published: 11/1/2006
Authors: David G Seiler, John S Suehle
Abstract: This special article in Semiconductor International discusses NIST's role in metrology for the semiconductor industry as it moves to the nanoscale regime.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32487

13. Special Section on the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Published: 11/1/2006
Author: David G Seiler
Abstract: Since 1995, the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly titled "Characterization and Metrology for ULSI Technology") has provided a forum for the characterization and metrology community t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32443

14. National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report
Published: 8/1/2006
Authors: Michael T Postek, Richard R Cavanagh, C M Allocca, Douglas T Smith, Robert D Shull, David A Wollman, David G Seiler, Stephen Knight, A Diebold, Richard M Silver, Charles W Clark, Kevin W Lyons, James R Whetstone, Ronald F Boisvert
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822247

15. Government Jobs for Physicists: Believe It or Not Challenging and Satisfying!
Published: 5/30/2006
Author: David G Seiler
Abstract: This presentation details the benefits of government positions for physicists based on the experiences of a NIST Division Chief.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32273

16. Extending CMOS Measurements to the Nanoscale
Published: 3/7/2006
Author: David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32200

17. Characterization and Metrology for ULSI Technology: 2005
Published: 9/28/2005
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Caroline Ayre, Rajinder P. Khosla, Stefan Zollner, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32093

18. Characterization and Metrology for ULSI Technology: 2003
Published: 9/30/2003
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, Stefan Zollner, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31463

19. Semiconductor Electronics Division
Series: NIST Interagency/Internal Report (NISTIR)
Published: 9/30/2003
Authors: David G Seiler, Erik M Secula
Abstract: This is a high-level, full-color brochure detailing the activities and challenges of the Semiconductor Electronics Division. Topics include Division history, nanotechnology, MEMS, electrical test structures, power electronics, optical and electrical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31371

20. Characterization and Metrology for ULSI Technology: 2000
Published: 2/1/2001
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, R. C. McDonald, W M Bullis, P. J. Smith, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11480



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