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Author: steven phillips
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Displaying records 11 to 20 of 53 records.
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11. Uncertainty Due to Finite Resolution Measurements
Published: 5/1/2008
Authors: Steven David Phillips, Blaza Toman, William Tyler Estler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912361

12. Laser Tracker Testing at NIST Using the ASME B89.4.19 Standard
Published: 1/1/2007
Authors: Balasubramanian Muralikrishnan, Christopher J Blackburn, Daniel S Sawyer, Bruce R. Borchardt, William Tyler Estler, Steven David Phillips
Abstract: While the versatility and economics of laser trackers are quite appealing, the ability to assess their accuracy and to compare various brands has been limited by a lack of a national or international standard that encompasses testing and traceability ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824608

13. Laser Trackers: Testing and Standards
Published: 1/1/2007
Author: Steven David Phillips
Abstract: Laser trackers are now the tool of choice for large scale coordinate metrology.  They are transportable allowing reconfigurable production facilities at a lower capital cost than large CMMs.  Trackers now include absolute distance measuring ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824609

14. Large-Scale Metrology Instrument Performance Evaluations at NIST
Published: 1/1/2006
Authors: William Tyler Estler, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips
Abstract: The ASME B89 Committee on Dimensional Metrology has approved a new American National Standard B89.4.19 - Performance Evaluation of Laser Based Spherical Coordinate Measurement Systems. This Standard, to be published in 2006, specifies test methods fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824607

15. Recent Developments in the Standardization and Testing of Laser Trackers
Published: 1/1/2006
Authors: Daniel S Sawyer, Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823203

16. Measurement Uncertainty, CMMs, and Standards: Today and the Future
Published: 1/1/2005
Author: Steven David Phillips
Abstract: Over the past decade modern measurement uncertainty evaluation has evolved from an obscure art practiced at National Measurement Institutes (NMIs) to an increasingly intertwined aspect of industrial metrology.  This paper examines the progressio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824610

17. Measurement Uncertainty and Traceability Issues: A Standards Activity Update
Published: 1/1/2004
Author: Steven David Phillips
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824611

18. Uncertainty Due to Finite Resolution Measurements
Published: 1/1/2004
Authors: Steven David Phillips, B Tolman, William Tyler Estler
Abstract: We investigate the influence of finite resolution on measurement uncertainty from a perspective of the Guide to the Expression of Uncertainty in Measurement (GUM). Finite resolution in the presence of Gaussian noise yields a distribution of results t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822244

19. Validation of CMM Task Specific Measurement Uncertainity Software
Published: 8/1/2003
Authors: M P Henke, J M Baldwin, K Summerhays, B Rasnick, P Murray, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Craig M Shakarji
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. REcently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822066

20. Measurement Uncertainty and Traceability Issues in National and International Measurements
Published: 5/1/2003
Author: Steven David Phillips
Abstract: This paper discusses some recent laboratory intercomparisons with emphasis on the success of the uncertainty statement to include the reference value. Some factors that affect this capability are discussed. Recently developed national and internation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822031