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Author: steven phillips

Displaying records 31 to 40 of 56 records.
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31. Design and Testing of a One Dimensional Measuring Machine for Determining the Length of Ball Bars
Published: 1/1/2001
Authors: J C Ziegert, D Rea, Steven David Phillips, Bruce R. Borchardt
Abstract: A new machine for the rapid calibration of ball bars has been built.  By means of comparisons to CMM measurements, it has been shown to work as an accurate special purpose machine for the calibration of ball bar lengths.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823144

32. Precision Measurements in the New Millennium: Predictions, Opportunity and Progress
Published: 1/1/2001
Author: Steven David Phillips
Abstract: As the theme of this year''s International Dimensional Metrology Workshop is Dimensional Metrology - Precision Measurements in the New Millennium, it is interesting to consider the pervasiveness of dimensional metrology in our industrial soci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821589

33. Traceability Calibration, & Measurement Uncertainty Issues Regarding Coordinate Measuring Machines and Other Complex Instruments
Published: 6/1/2000
Author: Steven David Phillips
Abstract: The modern definition of traceability intimately links the concepts of calibration (i.e., connection to the SI unit) and measurement uncertainty. In a typical coordinate measuring machine (CMM) measurement problem the measurement under consideration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820969

34. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2000
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, David E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820971

35. A General Quantitative Method to Validate Instrument Calibration Techniques
Published: 11/1/1999
Author: Steven David Phillips
Abstract: In this paper a method to validate proposed calibration procedures for coordinate measuring machines (CMMs) is presented. Conceptually, the validation procedure is based on a computer generated population of CMMs assumed to include any real CMM that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820940

36. Improving Kinematic Touch Trigger Probe Performance
Published: 4/1/1999
Authors: Steven David Phillips, William Tyler Estler
Abstract: Kinematic touch trigger probes are widely used on CMMs. This article gives CMM users advice on how to minimize the systematic errors associated with this class of probes.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820943

37. A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty
Published: 1/1/1999
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, K Eberhardt, M Levenson, Marjorie A McClain, Ted Hopp
Abstract: We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated with the instrument under consideration from the set of all possible instrument errors. T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820941

38. Measurement Uncertainty and Uncorrected Bias
Published: 1/1/1999
Authors: Steven David Phillips, K Eberhardt, William Tyler Estler
Abstract: This paper discusses the distinction between measurement uncertainty, measurement errors and their role in the calibration process. The issue of including uncorrected bias is addressed and a method to extend the current ISO Guide to the Expression of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820942

39. Calculation of Measurement Uncertainty Using Prior Information
Published: 11/1/1998
Authors: Steven David Phillips, William Tyler Estler
Abstract: We describe the use of Bayesian inference to include prior information about the value of the measurand in the calculation of measurement uncertainty. Typical examples show this can, in effect, reduce the expanded uncertainty by up to 85 %. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820904

40. The Estimation of Measurement Uncertainty of Small Circular Features Measured by Coordinate Measuring Machines
Published: 4/1/1998
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler, J Buttress
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy; i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820903



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