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1. A Pulsed Time-of-flight Mass Spectrometer for Liquid Secondary Ion Mass Spectrometry
Published: 7/12/1988
Authors: James K Olthoff, I. A. Lys, R. J. Cotter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32418

2. A Search for Possible `Universal-Applications' Gas Mixtures
Published: 12/1/1998
Authors: Loucas G. Christophorou, James K Olthoff, David S. Green
Abstract: In an effort to respond to the recent concerns over the possible impact of SF^d6^ on global warming, we have searched for an SF^d6^ substitute gas that could be used in high voltage equipment instead of pure SF^d6^, with minimal changes in practice, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19048

3. Absolute Spatially- and Temporally-Resolved Optical Emission Measurements of rf Glow Discharges in Argon
Series: Journal of Research (NIST JRES)
Published: 3/1/1993
Authors: S. Djurovic, J R Roberts, Mark A Sobolewski, James K Olthoff
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2222

4. Absolute Spatially- and Temporally-Resolved Optical Emission Measurements of rf Glow Discharges in Argon
Series: Journal of Research (NIST JRES)
Published: 1/1/1993
Authors: S Djurovi, J R Roberts, M A Sobolewski, James K Olthoff
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102073

5. Anion States of n4-polyene iron triacarbonyl complexes
Published: 12/15/1987
Authors: James K Olthoff, J. H. Moore, J. A. Tossell, A. Gabutti, E J Baerends
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32417

6. Appearance Potentials of Ions Produced by Electron-Impact Induced Dissociative Ionization of SF^d6^ and Related Compounds
Published: 3/1/1995
Authors: Ken L. Stricklett, J. M. Kassoff, James K Olthoff, Richard J. Van Brunt
Abstract: Methods are described, which are based on the use of a commercial mass spectrometer, for determination of ionization and fragment ion appearance potentials by electron impact. These methods are applied to the principal sulfur-bearing compounds produc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27876

7. Applications of Electron-Interaction Reference Data to the Semiconductor Industry
Published: 12/1/1998
Authors: Loucas G. Christophorou, James K Olthoff
Abstract: Many advanced plasma diagnostic techniques and plasma models require fundamental physical data in order to make accurate measurements or predictions. Fundamental electron-interaction data are among the most critical since electron collisions are the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6001

8. Boltzmann Analysis of Electron Swarm Parameters in CF^d4^ Using Independently Assessed Electron-Collision Cross Sections
Published: 10/1/1999
Authors: M. C. Bordage, P. Segur, Loucas G. Christophorou, James K Olthoff
Abstract: Using independently assessed electron-collision cross sections, electron swarm parameters were calculated via the solution of the Boltzmann equation under the hydrodynamic regime. The cross sections used for the calculations were from a previously p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24276

9. Catalytic Decomposition of S2F10 and Its Implications on Sampling and Detection from SF6-Insulated Equipment
Published: 6/1/1990
Authors: James K Olthoff, Richard J. Van Brunt, J T. Herron, George Gibson Harman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17679

10. Characterization and Calibration of a BIT/RGA for Use as a Plasma Processing Diagnostic
Published: 8/1/1993
Authors: James K Olthoff, Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21541



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