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You searched on: Author: james olthoff Sorted by: date

Displaying records 101 to 110 of 134 records.
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101. Diagnostic Measurements in RF Plasmas for Materials Processing
Published: 7/1/1992
Authors: J R Roberts, James K Olthoff, Mark A Sobolewski, Richard J. Van Brunt, James R Whetstone, S. Djurovic

102. Rate of S2F10 Production from Negative Corona in Compressed SF6
Published: 6/1/1992
Authors: Richard J. Van Brunt, James K Olthoff, M. Shah

103. Mass Spectromic and Optical Emission Diagnostics for rf Plasma Reactors
Published: 2/1/1992
Authors: James K Olthoff, J R Roberts, Richard J. Van Brunt, James R Whetstone, Mark A Sobolewski, S. Djurovic

104. Metrology Requirements of Future Space Power Systems
Published: 1/1/1992
Authors: James K Olthoff, Robert E. Hebner

105. S2F10 Formation by Electrical Discharges in SF6: Comparison of Spark and Corona
Published: 10/1/1991
Authors: I. Sauers, George Gibson Harman, James K Olthoff, Richard J. Van Brunt

106. Total Cross Sections for Electron Scattering and Attachment for SF6 and its Electric Discharge By-Products
Published: 10/1/1991
Authors: James K Olthoff, Richard J. Van Brunt, H. X. Wan, J. H. Moore, J. A. Tossell

107. Electron Attachment to SF6 and SO2
Published: 7/1/1991
Authors: James K Olthoff, Richard J. Van Brunt, H. X. Wan, J. H. Moore

108. Off-Axis Measurements of Ion Kinetic Energies in RF Plasmas
Published: 7/1/1991
Authors: S. B. Radovanov, James K Olthoff, Richard J. Van Brunt

109. Detection of Trace Disulfur Decafluoride in Sulfur Hexafluoride by Gas Chromotography/Mass Spectrometry
Published: 4/1/1991
Authors: James K Olthoff, Richard J. Van Brunt, J T. Herron, I. Sauers

110. Measurements on the NIST GEC Reference Cell
Published: 1/1/1991
Authors: J R Roberts, James K Olthoff, Richard J. Van Brunt, James R Whetstone

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