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You searched on: Author: yoshihiro ohno Sorted by: date

Displaying records 31 to 40 of 176 records.
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31. -Measurement of Solid-State Lighting Products,-
Published: 1/1/2007
Authors: Yoshihiro Ohno, Carl C Miller

32. -Measuring Color Quality of Light Sources,-
Published: 1/1/2007
Authors: Wendy L Davis, Yoshihiro Ohno

33. New photometer standards for low uncertainty illuminance scale realization
Published: 1/1/2007
Authors: George P Eppeldauer, Carl C Miller, Yoshihiro Ohno

34. Simple Spectral Stray Light Correction Method for Array Spectroradiometers
Published: 2/20/2006
Authors: Yuqin Zong, Steven W Brown, Bettye C Johnson, Keith R Lykke, Yoshihiro Ohno
Abstract: In many applications, the measurement accuracy of spectroradiometers, particularly instruments with a single dispersive element, is limited by the presence of stray radiation within the instrument. A simple, practical method has been developed to co ...

35. Calibration and Characterization of UV Sensors for Water Disinfection
Published: 1/2/2006
Authors: Thomas C Larason, Yoshihiro Ohno
Abstract: Ultraviolet radiation (UV) effectively inactivates common pathogens found in ground and surface waters such as Cryptosporidium, Giardia, and most bacterial pathogens (e. g., E. coli). Water treatment facilities recently started using ultraviolet rad ...

36. A Spectrally Tunable LED Sphere Source Enables Accurate Calibration of Tristimulus Colorimeters
Published: 1/1/2006
Authors: Irena Fryc, Steven W Brown, Yoshihiro Ohno

37. A spectrally tunable LED sphere source enables accurate calibration of tristimulus colorimeters
Published: 1/1/2006
Authors: Steven W Brown, Irena Fryc, Yoshihiro Ohno

38. Development of a Color Quality Scale
Published: 1/1/2006
Authors: Wendy L Davis, Yoshihiro Ohno

39. Development of the NIST Detector-based Color Temperature Scale
Published: 1/1/2006
Authors: George P Eppeldauer, Yoshihiro Ohno

40. Evaluation of Colour Difference Formulae for Colour Rendering Metrics
Published: 1/1/2006
Authors: Wendy L Davis, Yoshihiro Ohno

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series