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You searched on: Author: yoshihiro ohno Sorted by: date

Displaying records 31 to 40 of 175 records.
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31. -Measuring Color Quality of Light Sources,-
Published: 1/1/2007
Authors: Wendy L Davis, Yoshihiro Ohno

32. New photometer standards for low uncertainty illuminance scale realization
Published: 1/1/2007
Authors: George P Eppeldauer, Carl C Miller, Yoshihiro Ohno

33. Simple Spectral Stray Light Correction Method for Array Spectroradiometers
Published: 2/20/2006
Authors: Yuqin Zong, Steven W Brown, Bettye C Johnson, Keith R Lykke, Yoshihiro Ohno
Abstract: In many applications, the measurement accuracy of spectroradiometers, particularly instruments with a single dispersive element, is limited by the presence of stray radiation within the instrument. A simple, practical method has been developed to co ...

34. Calibration and Characterization of UV Sensors for Water Disinfection
Published: 1/2/2006
Authors: Thomas C Larason, Yoshihiro Ohno
Abstract: Ultraviolet radiation (UV) effectively inactivates common pathogens found in ground and surface waters such as Cryptosporidium, Giardia, and most bacterial pathogens (e. g., E. coli). Water treatment facilities recently started using ultraviolet rad ...

35. A Spectrally Tunable LED Sphere Source Enables Accurate Calibration of Tristimulus Colorimeters
Published: 1/1/2006
Authors: Irena Fryc, Steven W Brown, Yoshihiro Ohno

36. A spectrally tunable LED sphere source enables accurate calibration of tristimulus colorimeters
Published: 1/1/2006
Authors: Steven W Brown, Irena Fryc, Yoshihiro Ohno

37. Development of a Color Quality Scale
Published: 1/1/2006
Authors: Wendy L Davis, Yoshihiro Ohno

38. Development of the NIST Detector-based Color Temperature Scale
Published: 1/1/2006
Authors: George P Eppeldauer, Yoshihiro Ohno

39. Evaluation of Colour Difference Formulae for Colour Rendering Metrics
Published: 1/1/2006
Authors: Wendy L Davis, Yoshihiro Ohno

40. Optical Metrology for LEDs and Solid State Lighting
Published: 1/1/2006
Author: Yoshihiro Ohno

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
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