NIST logo

Publications Portal

You searched on: Author: yoshihiro ohno Sorted by: date

Displaying records 141 to 150 of 176 records.
Resort by: Date / Title

141. Realization of NIST 1995 Luminous Flux Scale Using Integrating Sphere Method
Published: 1/1/1996
Author: Yoshihiro Ohno

142. The NIST Detector-Based Luminous Intensity Scale
Published: 1/1/1996
Authors: C L Cromer, George P Eppeldauer, Jonathan E Hardis, Thomas C Larason, Yoshihiro Ohno, Albert C Parr

143. 1993 Intercomparison of Photometric Units Maintained at NIST (USA) and PTB (Germany)
Published: 1/1/1995
Authors: Yoshihiro Ohno, G Sauter

144. New Method for Realizing Total Flux Scale Using an Integrating Sphere with an External Source
Published: 1/1/1995
Author: Yoshihiro Ohno

145. New Technologies for Optical Radiation Measurements
Published: 1/1/1995
Author: Yoshihiro Ohno

146. Realization of NIST Luminous Flux Scale Using an Integrating Sphere with an External Source
Published: 1/1/1995
Author: Yoshihiro Ohno

147. Integrating Sphere Simulation: Application to total Flux Scale Realization
Published: 1/1/1994
Author: Yoshihiro Ohno

148. The Detector-Based Candela Scale and Related Photometric Calibration Procedures at NIST
Published: 1/1/1994
Authors: Yoshihiro Ohno, C L Cromer, Jonathan E Hardis, George P Eppeldauer

149. Silicon Photodiode Self-Calibration Using White Light for Photometric Standards: Theoretical Analysis
Published: 1/1/1992
Author: Yoshihiro Ohno

150. A Flexible Bandpass Correction Method for Spectrometers
Published: Date unknown
Author: Yoshihiro Ohno
Abstract: An improved method for the correction of bandpass errors in spectrometers has been developed. This method is an improvement over the Stearns and Stearns method, which is limited in use to a triangular bandpass function and requires the bandwidth be ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series