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Displaying records 141 to 150 of 180 records.
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141. Interference-Filter Characterization of Spectraradiometers and Colorimeters
Published: 5/1/1996
Authors: Paul A Boynton, Yoshihiro Ohno, Edward F. Kelley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2831

142. Analysis of Integrating Sphere Errors for Lamps Having Different Angular Intensity Distributions
Published: 1/1/1996
Authors: Yoshihiro Ohno, M Lindermann, G Sauter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104837

143. Characterization of Modified FEL Quartz-Halogen Lamps for Photometric Standards
Published: 1/1/1996
Authors: Yoshihiro Ohno, J K Jackson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104085

144. Improved Photometric Standards and Calibration Procedures at NIST
Published: 1/1/1996
Author: Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104084

145. Realization of NIST 1995 Luminous Flux Scale Using Integrating Sphere Method
Published: 1/1/1996
Author: Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104083

146. The NIST Detector-Based Luminous Intensity Scale
Published: 1/1/1996
Authors: C L Cromer, George P Eppeldauer, Jonathan E Hardis, Thomas C Larason, Yoshihiro Ohno, Albert C Parr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103702

147. 1993 Intercomparison of Photometric Units Maintained at NIST (USA) and PTB (Germany)
Published: 1/1/1995
Authors: Yoshihiro Ohno, G Sauter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104086

148. New Method for Realizing Total Flux Scale Using an Integrating Sphere with an External Source
Published: 1/1/1995
Author: Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104087

149. New Technologies for Optical Radiation Measurements
Published: 1/1/1995
Author: Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104699

150. Realization of NIST Luminous Flux Scale Using an Integrating Sphere with an External Source
Published: 1/1/1995
Author: Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104698



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