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Author: yoshihiro ohno
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Displaying records 141 to 150 of 170 records.
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141. Chapter A.2.1 Photometry, Handbook of Optoelectronics
Published: Date unknown
Author: Yoshihiro Ohno
Abstract: General introduction to photometry, radiometry, and colorimetry is given. The chapter consists of the following sections:1. Introduction2. Basis of Physical Photometry (2.1 Visual response, 2.2 Photometric base unit the candela)3. Quantities and Uni ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841682

142. Color Rendering
Published: Date unknown
Author: Yoshihiro Ohno
Abstract: LED technologies are advancing at a swift pace and solid-state lighting (SSL) products are already introduced to the market and expected to grow rapidly. There is an increasing interest and concern in the color rendering properties of white SSL produ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841164

143. Color Rendering and Luminous Efficacy of White LED Spectra
Published: Date unknown
Author: Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841832

144. Colorimetric Accuracies and Concerns in Spectroradiometry of LEDs
Published: Date unknown
Authors: C Jones, Yoshihiro Ohno
Abstract: LEDs are narrow-band emission sources and present special problems in colorimetric characterization. Chromaticity space is mapped using Gaussian spectral models to represent narrow-band emission sources. The Gaussian maps show that the spectral regi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841421

145. Correction of Stray Light In Spectroradiometers and Imaging Instruments
Published: Date unknown
Authors: Yuqin Zong, Steven W Brown, Keith R Lykke, Yoshihiro Ohno
Abstract: Measurement errors from stray light, spectral or spatial, are inevitable and are often the dominant source of error in spectroradiometers and imaging radiometers/photometers. We have developed a simple matrix method for correcting spatial stray light ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841072

146. Correction of Stray Light in Spectrographs: Implications for Remote Sensing
Published: Date unknown
Authors: Yuqin Zong, Steven W Brown, Bettye C Johnson, Keith R Lykke, Yoshihiro Ohno
Abstract: Spectrographs are used in a variety of applications in the field of remote sensing for radiometric measurements due to the benefits of measurement speed, sensitivity, and portability. However, spectrographs are single grating instruments that are su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840972

147. Detector-Based Integrating Sphere Photometry
Published: Date unknown
Authors: Yoshihiro Ohno, Yuqin Zong
Abstract: A new luminous flux calibration facility using a 2.5 m integrating sphere has been developed at NIST. The Absolute Integrating-Sphere Method, developed for realization of the lumen in 1995, has been applied to routine calibration measurements of lum ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841338

148. Detector-Based Sphere Photometry for Industry
Published: Date unknown
Authors: Yoshihiro Ohno, R S Bergman
Abstract: The Absolute Integrating Sphere Method is now used at NIST for the detector-based calibration of total luminous flux of lamps, as well as for the realization of the lumen. This method has many benefits for high-accuracy applications, allowing for me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840126

149. Development and Application Issues of a Spectrally Tunable LED Source
Published: Date unknown
Authors: George P Eppeldauer, Steven W Brown, G Dezsi, Irena Fryc, Yoshihiro Ohno
Abstract: A spectrally tunable solid state source based on Light Emitting Diodes (LEDs) is being developed at the National Institute of Standards and Technology (NIST). The tunable source will emulate the spectral distributions of various light sources and can ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841824

150. Development of a Color Quality Scale
Published: Date unknown
Authors: Wendy L Davis, Yoshihiro Ohno
Abstract: A new metric for evaluating the color quality of light sources is being developed at NIST, in close contact with the lighting industry and the CIE. The current CIE Color Rendering Index (CRI) is outdated and has several known deficiencies. The CRI o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841013



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