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Displaying records 51 to 56.
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51. Standardization of LED Measurements
Published: 1/1/2004
Authors: Carl C Miller, Yoshihiro Ohno

52. Standardization of LED Measurements Updates
Published: Date unknown
Authors: Carl C Miller, Yoshihiro Ohno
Abstract: The article describes the current LED standards and recommendations. It also discusses the work in Commission Internationale De L Eclairage Technical Committees to form new recommendations for LED measurements of total luminous flux, partial LED flu ...

53. Standardization of LED Measurements - updates
Published: 1/1/2004
Authors: Carl C Miller, Yoshihiro Ohno

54. Statistical Methods for Analyzing Color Differences
Published: 6/2/2011
Authors: Maria E Nadal, Carl C Miller, Hugh Fairman
Abstract: Multi-valued measurands, such as spectral reflectance or transmission, tristimulus values, are usually analyzed by reducing the data to a single-valued parameter, such as color difference. The variations of sets of color differences are non-normal d ...

55. Summary of NIST Short Courses offered by the Optical Technology Division
Published: 1/1/2005
Authors: Carl C Miller, Howard W Yoon, Bettye C Johnson, Yoshihiro Ohno

56. Total Luminous Flux Calibrations of LEDs at NIST
Published: 8/1/2001
Authors: Carl C Miller, Yoshihiro Ohno
Abstract: The total luminous flux (lumen) is one of the most important characteristics of Light Emitting Diodes (LEDs), and is commonly measured using integrating sphere photometers. Large variations of measurement results are reported among different manufac ...

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