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Author: thomas lucatorto
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Displaying records 11 to 20 of 108 records.
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11. Characterisation of the Response of Chromium-Doped Alumina Screens in the Vacuum Ultraviolet Using Synchrotron Radiation
Published: 12/1/2002
Authors: James K McCarthy, A Baciero, B Zurro, Uwe Arp, Charles S Tarrio, Thomas B Lucatorto, A Morono, P Martin, E R Hodgson
Abstract: We have measured the response of chromium-doped alumina screens to vacuum ultraviolet radiation and derived quantum efficiency curves for the energy range from 30 to 300 eV. A model is presented to explain the structure in this curve. In addition, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840027

12. Characterization of Materials Using an Ultraviolet Radiometric Beamline at SURF III
Published: 1/1/2000
Authors: Ping-Shine Shaw, R Gupta, Thomas Avery Germer, Uwe Arp, Thomas B Lucatorto, Keith R Lykke
Abstract: The completion of the upgrade of the synchrotron facilities at the National Institute of Standards and Technology (NIST) has yielded a better-characterization broadband source of ultraviolet (UV) radiation at the Synchrotron Ultraviolet Radiation Fa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841389

13. Characterization of Materials using UV Radiometric Beamline at SURF III
Published: 1/1/2000
Authors: Ping-Shine Shaw, R Gupta, Thomas Avery Germer, Uwe Arp, Thomas B Lucatorto, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104166

14. Characterization of materials using an ultraviolet radiometric beamline at SURF III,
Published: 1/1/2000
Authors: Ping-Shine Shaw, R Gupta, Thomas Avery Germer, Uwe Arp, Thomas B Lucatorto, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101715

15. Characterization of the Coherent Microwave Emission From the Surf II Synchrotron Storage Ring
Published: 7/1/1997
Authors: Gerald T Fraser, Angela R Hight Walker, Thomas B Lucatorto, Uwe Arp, K. K. Lehmann
Abstract: The temporal profile and frequency spectrum of the microwave emission from the Synchrotron Ultraviolet Radiation Facility [SURF II] electron storage ring at the National Institute of Standards and Technology have been studied to access the utility of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841229

16. Characterization of the response of chromium-doped alumina screens in the vacuum ultraviolet using synchrotron radiation,
Published: 1/1/2002
Authors: James K McCarthy, A Baciero, B Zurro, Uwe Arp, Charles S Tarrio, Thomas B Lucatorto, A Morono, P Martin, E R Hodgson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101617

17. Comment on: Two-Photon Absorption Series of Calcium,
Published: 1/1/1995
Authors: J R Krumrine, Arlene Musgrove, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101592

18. Configuration-Dependent AC Stark Shifts in Calcium
Published: 1/1/1992
Authors: Q Li, Thomas R. O'Brian, Thomas B Lucatorto, T J McIlrath
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101608

19. Design considerations for a cascaded grating interferometer suitable for EUV interference lithography
Published: 4/10/2009
Authors: Zachary H Levine, Thomas B Lucatorto, Steven E Grantham
Abstract: The potential of a cascaded grating interferometer to perform Extreme Ultraviolet Interference Lithography (EUV-IL) depends on its beng coupled to a source that is bright enought to allow exposures ina reasonable time.   This work presents a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842467

20. Development of an EUVL collector with infrared radiation suppression
Published: 8/1/2014
Authors: Steven E Grantham, Mike Kriese, Yuriy Platonov, Bodo Ehlers, Licai Jiang, Jim Rodriguez, Mueller Ulrich, Shayna khatri, Adam Magruder, Charles S Tarrio, Thomas B Lucatorto
Abstract: Laser-produced plasma (LPP) sources for extreme ultraviolet lithography (EUVL) systems utilize CO2 lasers operating with wavelength 10.6μm. Since multilayer-coated optics have high reflectivity for this infrared radiation (IR), a significant and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915696



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