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Author: thomas lucatorto
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Displaying records 101 to 109.
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101. Ultraviolet Radiometry With Synchrotron Radiation and Cryogenic Radiometer
Published: 1/1/1999
Authors: Ping-Shine Shaw, Keith R Lykke, Thomas R. O'Brian, Arp Uwe, H H White, Thomas B Lucatorto, J L Dehmer, Albert C Parr, R Gupta
Abstract: The combination of a cryogenic radiometer and synchrotron radiation enablesdetector scale realization in spectral regions that are otherwise difficult to access. Cryogenic radiometry is the most accurate primary detector-based standard available to d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841281

102. Upgraded Facility for Multilayer Mirror Characterization at NIST, ed. by N.M. Ceglio
Published: 1/1/1991
Authors: R N. Watts, D L Ederer, R Deslattes, Thomas B Lucatorto, W T Estler, C J Evans, Theodore Vincent Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100211

103. Upgraded Facility for Multilayer Mirror Characterization at NIST, ed. by N.M. Seglio
Published: 1/1/1991
Authors: R N. Watts, D L Ederer, R Deslattes, Thomas B Lucatorto, W T Estler, C J Evans, T V Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102936

104. Upgrades to the NIST/DARPA EUV Reflectometry Facility
Published: 12/1/2001
Authors: Charles S Tarrio, Thomas B Lucatorto, S Grantham, M B Squires, Uwe Arp, Lu Deng
Abstract: We have recently installed a new sample chamber at the NIST/DARPA EUV Reflectometry Facility at the National Institute of Standards and Technology. The chamber replaces a much smaller system on Beamline 7 at the Synchrotron Ultraviolet Radiation Fac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841579

105. Verification of the Ponderomotive Approximation for the ac Stark Shift in Xe Rydberg Levels,
Published: 1/1/1994
Authors: Thomas R. O'Brian, J -B Kim, G Lan, T J McIlrath, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101654

106. XUV Optics Characterization at NIST
Published: 1/1/1993
Authors: R N. Watts, Charles S Tarrio, Thomas B Lucatorto, R P. Madden, R Deslattes, Estler W Caticha, C J Evans, T Mcwaid, Jing Fu, T V Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102589

107. XUV Optics Characterization at NIST,
Published: 1/1/1992
Authors: R N. Watts, Charles S Tarrio, Thomas B Lucatorto, R P. Madden, R Deslattes, Ariel Caticha, A Henins
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100210

108. XUV Optics Characterization at NIST,
Published: 1/1/1992
Authors: R N. Watts, Charles S Tarrio, Thomas B Lucatorto, R P. Madden, R Deslattes, Ariel Caticha, Albert Henins
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101843

109. XUV Optics Characterization at the National Institute of Standards and Technology
Published: 1/1/1993
Authors: R N. Watts, Charles S Tarrio, Thomas B Lucatorto, R P. Madden, R Deslattes, Ariel Caticha, William Tyler Estler, Christopher J. Evans, T. McWade, Joseph Fu, Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901965



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