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Displaying records 91 to 100 of 111 records.
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91. Scanning Capacitance Microscopy Measurements and Modeling: Progress Towards Dopant Profiling of Silicon
Published: 12/31/1995
Authors: Joseph J Kopanski, Jay F. Marchiando, J R. Lowney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9950

92. Scanned Probe Techniques for the Electrical Characterization of Semiconductor Devices
Published: 7/1/1995
Authors: John A Dagata, Joseph J Kopanski
Abstract: The spatial resolution, sensitivity, and accuracy required for electrical characterization of device structures in the semiconductor industry suggest that scanned probe microscopy (SPM) tools may offer an alternative to existing measurement technique ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820733

93. Scanning Probe Techniques for the Electrical Characterization of Semiconductor Devices
Published: 7/1/1995
Authors: John A Dagata, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16678

94. Characterization of Two-Dimensional Dopant Profiles: Status and Review, Extended Abstracts
Published: 12/31/1994
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1068

95. Scanning Capacitance Microscopy for Profiling PN-Junctions in Silicon
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/1/1994
Authors: Joseph J Kopanski, Jay F. Marchiando, J R. Lowney, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27180

96. Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites
Series: Special Publication (NIST SP)
Published: 4/1/1994
Authors: David G Seiler, J R. Lowney, W. Robert Thurber, Joseph J Kopanski, George Gibson Harman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13439

97. Boron-Implanted 6H-SiC Diodes
Published: 8/1/1993
Authors: M Ghezzo, D. M. Brown, E. Downey, J K Kretchmer, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6302

98. Review of Semiconductor Microelectronic Test Structures with Applications to Infrared Detector Materials and Processes
Published: 7/1/1993
Authors: Joseph J Kopanski, C. E. Schuster
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11257

99. Charge Trapping in Cubic Silicon Carbide MIS Capacitors
Published: 12/31/1992
Author: Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6576

100. High Spatial Resolution Mapping of Resistivity Variations in Semiconductors
Published: 12/31/1992
Authors: Joseph J Kopanski, G. P. Carver, J R. Lowney, D. S. Miles, Donald B. Novotny
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19136



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