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You searched on: Author: joseph kopanski Sorted by: date

Displaying records 91 to 100 of 116 records.
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91. Two-Dimensional Scanning Capacitance Microscopy Measurements of Cross-Sectioned Very Large Scale Integration Test Structures
Published: 2/1/1996
Authors: G. Neubauer, A. Erickson, C. C. Williams, Joseph J Kopanski, M. Rodgers, D. Adderton
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23278

92. Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits
Published: 1/20/1996
Authors: Joseph J Kopanski, David L. Blackburn, George Gibson Harman, David Warren Berning
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5016

93. 2D-Scanning Capacitance Microscopy Measurement of Cross-Sectional VLSI Test Structures
Published: 12/31/1995
Authors: G. Neubauer, A. Erickson, C. C. Williams, Joseph J Kopanski, M. Rodgers, D. Adderton
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18647

94. Characterization of Two-Dimensional Dopant Profiles: Status and Review
Published: 12/31/1995
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24280

95. Oxidation of SiC, in Properties of Silicon Carbide
Published: 12/31/1995
Author: Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9046

96. Scanning Capacitance Microscopy Measurements and Modeling: Progress Towards Dopant Profiling of Silicon
Published: 12/31/1995
Authors: Joseph J Kopanski, Jay F. Marchiando, J R. Lowney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9950

97. Scanned Probe Techniques for the Electrical Characterization of Semiconductor Devices
Published: 7/1/1995
Authors: John A Dagata, Joseph J Kopanski
Abstract: The spatial resolution, sensitivity, and accuracy required for electrical characterization of device structures in the semiconductor industry suggest that scanned probe microscopy (SPM) tools may offer an alternative to existing measurement technique ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820733

98. Scanning Probe Techniques for the Electrical Characterization of Semiconductor Devices
Published: 7/1/1995
Authors: John A Dagata, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16678

99. Characterization of Two-Dimensional Dopant Profiles: Status and Review, Extended Abstracts
Published: 12/31/1994
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1068

100. Scanning Capacitance Microscopy for Profiling PN-Junctions in Silicon
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/1/1994
Authors: Joseph J Kopanski, Jay F. Marchiando, J R. Lowney, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27180



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