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Author: joseph kopanski

Displaying records 91 to 100 of 105 records.
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91. Boron-Implanted 6H-SiC Diodes
Published: 8/1/1993
Authors: M Ghezzo, D. M. Brown, E. Downey, J K Kretchmer, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6302

92. Review of Semiconductor Microelectronic Test Structures with Applications to Infrared Detector Materials and Processes
Published: 7/1/1993
Authors: Joseph J Kopanski, C. E. Schuster
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11257

93. Charge Trapping in Cubic Silicon Carbide MIS Capacitors
Published: 12/31/1992
Author: Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6576

94. High Spatial Resolution Mapping of Resistivity Variations in Semiconductors
Published: 12/31/1992
Authors: Joseph J Kopanski, G. P. Carver, J R. Lowney, D. S. Miles, Donald B. Novotny
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19136

95. High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride
Published: 8/1/1992
Authors: Joseph J Kopanski, J R. Lowney, Donald B. Novotny, David G Seiler, A. Simmons, J. Ramsey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12351

96. Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits
Published: 12/31/1991
Authors: Joseph J Kopanski, David L. Blackburn, George Gibson Harman, David W. Berning
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4347

97. High Spatial Resolution Mapping of Semiconductor Resistivity
Published: 12/31/1991
Authors: Joseph J Kopanski, J R. Lowney, D. S. Miles, Donald B. Novotny, G. P. Carver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18544

98. High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride
Published: 12/31/1991
Authors: Joseph J Kopanski, J R. Lowney, Donald B. Novotny, David G Seiler, A. Simmons, J. Ramsey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14956

99. Permittivity Measurements on Molecular-Sized Samples, Extended Abstract
Published: 12/1/1990
Authors: A. van Roggen, L. Yuwono, Hui Zhou, Paul H Meijer, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15920

100. Verification of the Relation Between Two-Probe and Four-Probe Resistances as Measured on Silicon Wafers
Published: 12/1/1990
Authors: Joseph J Kopanski, John Albers, G. P. Carver, James R. Ehrstein
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1227



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