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Author: simon kaplan
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Displaying records 61 to 70 of 73 records.
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61. Normal State ac Hall Effect in YBa^d2^Cu^d3^O^d7^ Thin Films
Published: 1/1/1996
Authors: Simon Grant Kaplan, S Wu, H T Lihn, H D Drew, Q Li, D B Fenner, J M Phillips, S Y Hou
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103923

62. Normal infrared spectral emittance of A1^d2^0^d3^
Published: 1/1/1998
Authors: Simon Grant Kaplan, Leonard M Hanssen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103919

63. Optical Evidence for the Dynamic Jahn-Teller Effect in Nd^d0.7^Sr^d0.3^MnO^d3^
Published: 1/1/1996
Authors: Simon Grant Kaplan, M Quijada, H D Drew, D B Tanner, G C Xiong, R Ramesh, C Kwon, T Venkatesan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103922

64. Optical Properties of Fluids For 248 nm and 193 nm Immersion Photolithography
Published: Date unknown
Authors: Simon Grant Kaplan, John H. Burnett
Abstract: We present measured values of the refractive index, thermo-optic coefficient, and absorption coefficient of a number of common organic solvents and aqueous inorganic solutions that may have application in immersion photolithography at 248 nm or 193 n ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840963

65. Problems Posed by Scattering Transmissive Materials for Accurate Transmittance and Reflectance Measurements
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: The characterization of the spectral transmittance and reflectance of windows and other optical components is a basic and important measurement. In principal, the measurements are relatively straightforward. However, even with an ideal high-accurac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841313

66. Problems posed by scattering transmissive materials for accurate transmittance and reflectance measurements
Published: 1/1/1998
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103849

67. Si as a Standard Material for Infrared Reflectance and Transmittance from 2 {mu}m to 5 {mu}m
Published: 1/1/2002
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104520

68. Silicon as a Standard Material for Infrared Reflectance and Transmittance From 2 to 5 m
Published: 12/1/2002
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: We have investigated the specular reflectance and transmittance of polished, high-resistivity single-crystal Si in the spectral range from 2 m to 5 m. Measurements were performed with a nearly collimated (-0.7 divergence) beam at angles of incidence ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841588

69. Standard Reference Materials: Infrared Transmittance Standards--SRM's 2053, 2054, 2055, and 2056
Series: Special Publication (NIST SP)
Report Number: 260-123
Published: 5/1/2001
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: Standard Reference Materials 2053, 2054, 2055, and 2056 are transmission filters designed to have nominally neutral attenuation over the 2 mm to 25 mm wavelength region, with optical densities near 1, 2, 3, and 4, respectively. The filters are made o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841489

70. Temperature Dependence of the Far-infrared Magneto-transmission of YBa^d2^Cu^d3^O^d7^ Films
Published: 1/1/1996
Authors: S Wu, Simon Grant Kaplan, H T Lihn, H D Drew, S Y Hou, J M Phillips, J C Barbour, E L Venturini, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104254



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