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Author: simon kaplan
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Displaying records 51 to 60 of 77 records.
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51. Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103844

52. Linearity Characterization of NIST's Infrared Spectral Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: System Linearity is a fundamental characterization performed on spectrophotometers. Yet it is one that is not adequately performed on Fourier transform instruments, because of the lack of a method for linearity characterization that will work suffici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841636

53. Measurement of the Far-infrared Magneto-conductivity Sensor of Superconducting YBa^d2^Cu^d3^O^d7^ Thin Films
Published: 1/1/1996
Authors: H-T S Lihn, S Wu, H D Drew, Simon Grant Kaplan, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103973

54. Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K
Published: 9/1/2002
Authors: Simon Grant Kaplan, M E Thomas
Abstract: We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm^u-1^ 10000 cm^u-1^ wave number range and temperatures from 10 K to 295 K. The refractive index is determine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841648

55. Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 NM
Published: Date unknown
Authors: John H. Burnett, Simon Grant Kaplan
Abstract: We discuss our approaches for measuring the absolute index (n) and its dependencies on wavelength (dn/d(lambda)) and temperature (dn/dT), of high-purity water for wavelengths near 193 nm, using the minimum deviation prism method and an interferometri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840659

56. Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 nm
Published: 1/1/2004
Authors: Simon Grant Kaplan, J H Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103910

57. Measurement of the refractive index and thermo-optic coefficient of water near 193 nm
Published: 1/1/2004
Authors: John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101993

58. Measurement of the refractive index and thermo-optic coefficient of water near 193 nm, ed. by Anthony Yen Page
Published: 1/1/2003
Authors: John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102649

59. Measurement of the refractive index and thermo-optic coefficient of water near 193nm, ed. by A. Yen
Published: 1/1/2003
Authors: J H Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104347

60. Methods for Absolute Reflectance Measurement of Transmissive Materials in the Infrared
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: Four methods for the measurement of absolute reflectance are described and compared, with particular emphasis on application to transmissive materials such as windows and filters. Three of the methods, the V-W , V-N , and goniometer based methods, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841311



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