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Author: simon kaplan
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Displaying records 51 to 60 of 73 records.
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51. Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 NM
Published: Date unknown
Authors: John H. Burnett, Simon Grant Kaplan
Abstract: We discuss our approaches for measuring the absolute index (n) and its dependencies on wavelength (dn/d(lambda)) and temperature (dn/dT), of high-purity water for wavelengths near 193 nm, using the minimum deviation prism method and an interferometri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840659

52. Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 nm
Published: 1/1/2004
Authors: Simon Grant Kaplan, J H Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103910

53. Measurement of the refractive index and thermo-optic coefficient of water near 193 nm
Published: 1/1/2004
Authors: John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101993

54. Measurement of the refractive index and thermo-optic coefficient of water near 193 nm, ed. by Anthony Yen Page
Published: 1/1/2003
Authors: John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102649

55. Measurement of the refractive index and thermo-optic coefficient of water near 193nm, ed. by A. Yen
Published: 1/1/2003
Authors: J H Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104347

56. Methods for Absolute Reflectance Measurement of Transmissive Materials in the Infrared
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: Four methods for the measurement of absolute reflectance are described and compared, with particular emphasis on application to transmissive materials such as windows and filters. Three of the methods, the V-W , V-N , and goniometer based methods, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841311

57. Methods for absolute reflectance measurement of transmissive materials in the infrared
Published: 1/1/1998
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103850

58. NIST Program for the Infrared Emittance Characterization of Materials for Thermal Conductivity29/Thermal Expansion 17
Published: Date unknown
Authors: Leonard M Hanssen, Sergey Mekhontsev, Simon Grant Kaplan
Abstract: Over the past decade and a half, the National Institute of Standards and Technology (NIST) has established measurement capabilities for the characterization of the spectral emittance of material samples in the infrared spectral range of 1 to 20 micro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841102

59. NIST-NPL Comparison of Mid-infrared Regular Transmittance and Reflectance
Published: 1/1/2003
Authors: C J Chunnilall, F J Clarke, Leonard M Hanssen, Simon Grant Kaplan, M P Smart
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104364

60. Normal Infrared Spectral Emittance of Al^d2^O^d3^
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: We have measured the near-normal ordinary ray transmittance and reflectance of crystalline Al^d2^O^d3^ from 1.6 m to 11 m and temperatures from 296 K to 582 K. The absorptance, or emittance, is derived from 1-(T+R), where T and R are the measured ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841310



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