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Displaying records 61 to 70 of 79 records.
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61. Testing and Improving the Radiometric Accuracy of FT-IR Transmittance Measurements
Published: 1/1/1997
Authors: Simon Grant Kaplan, Leonard M Hanssen, Raju Vsnu Datla
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104567

62. Testing the Radiometric Accuracy of FT-IR Transmittance Measurements
Published: 1/1/1997
Authors: Simon Grant Kaplan, Leonard M Hanssen, Raju Vsnu Datla
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103921

63. Measurement of the Far-infrared Magneto-conductivity Sensor of Superconducting YBa^d2^Cu^d3^O^d7^ Thin Films
Published: 1/1/1996
Authors: H-T S Lihn, S Wu, H D Drew, Simon Grant Kaplan, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103973

64. Normal State ac Hall Effect in YBa^d2^Cu^d3^O^d7^ Thin Films
Published: 1/1/1996
Authors: Simon Grant Kaplan, S Wu, H T Lihn, H D Drew, Q Li, D B Fenner, J M Phillips, S Y Hou
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103923

65. Optical Evidence for the Dynamic Jahn-Teller Effect in Nd^d0.7^Sr^d0.3^MnO^d3^
Published: 1/1/1996
Authors: Simon Grant Kaplan, M Quijada, H D Drew, D B Tanner, G C Xiong, R Ramesh, C Kwon, T Venkatesan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103922

66. Temperature Dependence of the Far-infrared Magneto-transmission of YBa^d2^Cu^d3^O^d7^ Films
Published: 1/1/1996
Authors: S Wu, Simon Grant Kaplan, H T Lihn, H D Drew, S Y Hou, J M Phillips, J C Barbour, E L Venturini, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104254

67. Grain Boundary Induced Magneto-Far Infrared Resonances in Superconducting YBa^d2^Cu^d3^O^d7-δ^ Thin Films
Published: 1/1/1995
Authors: H-T S Lihn, E J Choi, Simon Grant Kaplan, H D Drew, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103974

68. Characterization of Narrow-Band Infrared Interference Filters
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier-transform infrared (FT-IR) spectrophotometer system is used to measure the transmittance of infrared band-pass filters as a function of wavelength, temperature, and beam geometry. Measurements are performed using an f/4 beam geometry at no ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841309

69. FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier transform infrared (FT-IR) spectrometer-based broadband infrared ellipsometer has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841399

70. FT-IR Based Polarimeter with High-Quality Brewster-Angle Polarizers
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier transform infrared (FT-IR) spectrometer based broadband infrared polarimeter has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841753



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