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Author: simon kaplan
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Displaying records 61 to 70 of 73 records.
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61. Characterization of High-OD Ultrathin Infrared Neutral Density Filters
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen, Alan L Migdall, G Lefever-Button
Abstract: We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, fre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841303

62. Characterization of Narrow-Band Infrared Interference Filters
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier-transform infrared (FT-IR) spectrophotometer system is used to measure the transmittance of infrared band-pass filters as a function of wavelength, temperature, and beam geometry. Measurements are performed using an f/4 beam geometry at no ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841309

63. FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier transform infrared (FT-IR) spectrometer-based broadband infrared ellipsometer has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841399

64. FT-IR Based Polarimeter with High-Quality Brewster-Angle Polarizers
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier transform infrared (FT-IR) spectrometer based broadband infrared polarimeter has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841753

65. Far-Infrared Two-Phonon Absorption in GaP and GaAs
Published: Date unknown
Authors: Simon Grant Kaplan, H M Lawler, Eric L Shirley, S Bhat, M E Thomas
Abstract: We present detailed temperature dependent absorption spectra of GaP and GaAs at wavenumbers from 20 cm-1 to 350 cm-1 and temperatures between 10 K and 295 K. Comparison of the experimental data with the predictions of recent ab initio anharmonic lat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841846

66. Infrared Diffuse Reflectance Instrumentation and Standards at NIST
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: A spectrophotometer system for spectral characterization of materials in the infrared has been built around a bench-top Fourier transform (FTIR) instrument. Its capabilities include the measurement of directional-hemispherical reflectance from 1 *m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841308

67. Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 NM
Published: Date unknown
Authors: John H. Burnett, Simon Grant Kaplan
Abstract: We discuss our approaches for measuring the absolute index (n) and its dependencies on wavelength (dn/d(lambda)) and temperature (dn/dT), of high-purity water for wavelengths near 193 nm, using the minimum deviation prism method and an interferometri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840659

68. Methods for Absolute Reflectance Measurement of Transmissive Materials in the Infrared
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: Four methods for the measurement of absolute reflectance are described and compared, with particular emphasis on application to transmissive materials such as windows and filters. Three of the methods, the V-W , V-N , and goniometer based methods, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841311

69. NIST Program for the Infrared Emittance Characterization of Materials for Thermal Conductivity29/Thermal Expansion 17
Published: Date unknown
Authors: Leonard M Hanssen, Sergey Mekhontsev, Simon Grant Kaplan
Abstract: Over the past decade and a half, the National Institute of Standards and Technology (NIST) has established measurement capabilities for the characterization of the spectral emittance of material samples in the infrared spectral range of 1 to 20 micro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841102

70. Normal Infrared Spectral Emittance of Al^d2^O^d3^
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: We have measured the near-normal ordinary ray transmittance and reflectance of crystalline Al^d2^O^d3^ from 1.6 m to 11 m and temperatures from 296 K to 582 K. The absorptance, or emittance, is derived from 1-(T+R), where T and R are the measured ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841310



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