NIST logo

Publications Portal

You searched on: Author: simon kaplan Sorted by: date

Displaying records 11 to 20 of 78 records.
Resort by: Date / Title


11. Angle-dependent infrared reflectance measurements in support of VIIRS
Published: 8/14/2008
Authors: Simon Grant Kaplan, Leonard M Hanssen, Enrique J. Iglesias
Abstract: We have developed a goniometric reflectometer using a Fourier-transform infrared (FTIR) spectrometer source for polarized reflectance measurements from 1 um to 20 um wavelength at angles of incidence from 10° to 80°, with an incident beam geometry of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842529

12. High index optical materials for 193 nm immersion lithography
Published: 1/1/2006
Authors: Simon Grant Kaplan, J H Burnett, Eric L Shirley, D Horowitz, W Clauss, A Grenville, C Van peski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103909

13. Effect of Dissolved Air on the Density and Refractive Index of Water
Published: 9/30/2005
Authors: Allan H Harvey, Simon G. Kaplan, John H. Burnett
Abstract: We consider the effect of dissolved air on the density and the refractive index of liquid water from 0 ¿aC to 50 ¿aC. The density effect is calculated from the best available values of Henry's constants and partial molar volumes for the components of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50167

14. Effect of Dissolved Air on the Density and Refractive Index A. of Water
Published: 1/1/2005
Authors: H Harvey, Simon Grant Kaplan, John H. Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102135

15. High refractive index immersion fluids for 193 nm immersion lithography
Published: 1/1/2005
Authors: B Budhlall, G Parris, P Zhang, X Gao, Z Zarkov, B Ross, Simon Grant Kaplan, J Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101369

16. High-index materials for 193 nm immersion lithography
Published: 1/1/2005
Authors: J H Burnett, Simon Grant Kaplan, Eric L Shirley, P J Tompkins, J E Webb
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101372

17. Fluid refractive index measurements using roughened surface and prism minimum deviation techniques-
Published: 1/1/2004
Authors: R A Synowicki, G K Pribil, G Cooney, C M Herzinger, S E Green, Roger H French, Min K Yang, John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102555

18. Immersion Fluid Refractive Indices Using Prism Minimum Deviation Techniques, ed. by A. Yen
Published: 1/1/2004
Authors: Roger H French, Min K Yang, M F Lemon, R A Synowicki, G K Pribil, G Cooney, C M Herzinger, S E Green, John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102696

19. Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 nm
Published: 1/1/2004
Authors: Simon Grant Kaplan, J H Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103910

20. Measurement of the refractive index and thermo-optic coefficient of water near 193 nm
Published: 1/1/2004
Authors: John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101993



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series