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You searched on: Author: simon kaplan

Displaying records 71 to 79.
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71. Far-Infrared Two-Phonon Absorption in GaP and GaAs
Published: Date unknown
Authors: Simon Grant Kaplan, H M Lawler, Eric L Shirley, S Bhat, M E Thomas
Abstract: We present detailed temperature dependent absorption spectra of GaP and GaAs at wavenumbers from 20 cm-1 to 350 cm-1 and temperatures between 10 K and 295 K. Comparison of the experimental data with the predictions of recent ab initio anharmonic lat ...

72. Infrared Diffuse Reflectance Instrumentation and Standards at NIST
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: A spectrophotometer system for spectral characterization of materials in the infrared has been built around a bench-top Fourier transform (FTIR) instrument. Its capabilities include the measurement of directional-hemispherical reflectance from 1 *m ...

73. Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 NM
Published: Date unknown
Authors: John H. Burnett, Simon Grant Kaplan
Abstract: We discuss our approaches for measuring the absolute index (n) and its dependencies on wavelength (dn/d(lambda)) and temperature (dn/dT), of high-purity water for wavelengths near 193 nm, using the minimum deviation prism method and an interferometri ...

74. Methods for Absolute Reflectance Measurement of Transmissive Materials in the Infrared
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: Four methods for the measurement of absolute reflectance are described and compared, with particular emphasis on application to transmissive materials such as windows and filters. Three of the methods, the V-W , V-N , and goniometer based methods, ...

75. NIST Program for the Infrared Emittance Characterization of Materials for Thermal Conductivity29/Thermal Expansion 17
Published: Date unknown
Authors: Leonard M Hanssen, Sergey Mekhontsev, Simon Grant Kaplan
Abstract: Over the past decade and a half, the National Institute of Standards and Technology (NIST) has established measurement capabilities for the characterization of the spectral emittance of material samples in the infrared spectral range of 1 to 20 micro ...

76. Normal Infrared Spectral Emittance of Al^d2^O^d3^
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: We have measured the near-normal ordinary ray transmittance and reflectance of crystalline Al^d2^O^d3^ from 1.6 m to 11 m and temperatures from 296 K to 582 K. The absorptance, or emittance, is derived from 1-(T+R), where T and R are the measured ...

77. Optical Properties of Fluids For 248 nm and 193 nm Immersion Photolithography
Published: Date unknown
Authors: Simon Grant Kaplan, John H. Burnett
Abstract: We present measured values of the refractive index, thermo-optic coefficient, and absorption coefficient of a number of common organic solvents and aqueous inorganic solutions that may have application in immersion photolithography at 248 nm or 193 n ...

78. Problems Posed by Scattering Transmissive Materials for Accurate Transmittance and Reflectance Measurements
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: The characterization of the spectral transmittance and reflectance of windows and other optical components is a basic and important measurement. In principal, the measurements are relatively straightforward. However, even with an ideal high-accurac ...

79. Thermal, Structural, and Optical Properties of Multispectral Zinc Sulfide
Published: Date unknown
Authors: L Henneman, L LaCroix, C Wilson, S Kurzius, D C Harris, M Baronowski, B Burns, K Kitagawa, J Gembarovic, S Goodrich, Leonard M Hanssen, Simon Grant Kaplan, C Staats, J Mecholsky
Abstract: Lockheed Martin Space Systems Company (LMSSC) and Vicus Technologies have conducted a study to obtain the thermal, structural and optical property data required to predict the flight performance of Multispectral Zinc Sulfide (MS ZnS) windows. The Nav ...

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