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Author: simon kaplan

Displaying records 61 to 70 of 77 records.
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61. Normal State ac Hall Effect in YBa^d2^Cu^d3^O^d7^ Thin Films
Published: 1/1/1996
Authors: Simon Grant Kaplan, S Wu, H T Lihn, H D Drew, Q Li, D B Fenner, J M Phillips, S Y Hou
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103923

62. Optical Evidence for the Dynamic Jahn-Teller Effect in Nd^d0.7^Sr^d0.3^MnO^d3^
Published: 1/1/1996
Authors: Simon Grant Kaplan, M Quijada, H D Drew, D B Tanner, G C Xiong, R Ramesh, C Kwon, T Venkatesan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103922

63. Temperature Dependence of the Far-infrared Magneto-transmission of YBa^d2^Cu^d3^O^d7^ Films
Published: 1/1/1996
Authors: S Wu, Simon Grant Kaplan, H T Lihn, H D Drew, S Y Hou, J M Phillips, J C Barbour, E L Venturini, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104254

64. Grain Boundary Induced Magneto-Far Infrared Resonances in Superconducting YBa^d2^Cu^d3^O^d7-δ^ Thin Films
Published: 1/1/1995
Authors: H-T S Lihn, E J Choi, Simon Grant Kaplan, H D Drew, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103974

65. Characterization of High-OD Ultrathin Infrared Neutral Density Filters
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen, Alan L Migdall, G Lefever-Button
Abstract: We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, fre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841303

66. Characterization of Narrow-Band Infrared Interference Filters
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier-transform infrared (FT-IR) spectrophotometer system is used to measure the transmittance of infrared band-pass filters as a function of wavelength, temperature, and beam geometry. Measurements are performed using an f/4 beam geometry at no ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841309

67. FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier transform infrared (FT-IR) spectrometer-based broadband infrared ellipsometer has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841399

68. FT-IR Based Polarimeter with High-Quality Brewster-Angle Polarizers
Published: Date unknown
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A Fourier transform infrared (FT-IR) spectrometer based broadband infrared polarimeter has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841753

69. Far-Infrared Two-Phonon Absorption in GaP and GaAs
Published: Date unknown
Authors: Simon Grant Kaplan, H M Lawler, Eric L Shirley, S Bhat, M E Thomas
Abstract: We present detailed temperature dependent absorption spectra of GaP and GaAs at wavenumbers from 20 cm-1 to 350 cm-1 and temperatures between 10 K and 295 K. Comparison of the experimental data with the predictions of recent ab initio anharmonic lat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841846

70. Infrared Diffuse Reflectance Instrumentation and Standards at NIST
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: A spectrophotometer system for spectral characterization of materials in the infrared has been built around a bench-top Fourier transform (FTIR) instrument. Its capabilities include the measurement of directional-hemispherical reflectance from 1 *m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841308



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