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Author: simon kaplan

Displaying records 21 to 30 of 77 records.
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21. 40 Years of Metrology With Synchrotron Radiation at SURF
Published: 9/1/2003
Authors: Uwe Arp, Steven E Grantham, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
Abstract: the advantages of a compact synchrotron radiation source like the Synchrotron Ultraviolet Radiation Facility for metrology in the ultraviolet and extreme ultraviolet are shown. The capabilities of the different experimental stations are explained an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840164

22. Forty Years of Metrology with Synchrtron Radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100995

23. Forty years of metrology with synchrotron radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100997

24. Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan, Sergey Mekhontsev
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104518

25. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 1/1/2003
Authors: Simon Grant Kaplan, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103911

26. Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103844

27. Linearity Characterization of NIST's Infrared Spectral Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: System Linearity is a fundamental characterization performed on spectrophotometers. Yet it is one that is not adequately performed on Fourier transform instruments, because of the lack of a method for linearity characterization that will work suffici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841636

28. Measurement of the refractive index and thermo-optic coefficient of water near 193 nm, ed. by Anthony Yen Page
Published: 1/1/2003
Authors: John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102649

29. Measurement of the refractive index and thermo-optic coefficient of water near 193nm, ed. by A. Yen
Published: 1/1/2003
Authors: J H Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104347

30. NIST-NPL Comparison of Mid-infrared Regular Transmittance and Reflectance
Published: 1/1/2003
Authors: C J Chunnilall, F J Clarke, Leonard M Hanssen, Simon Grant Kaplan, M P Smart
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104364



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