NIST logo

Publications Portal

You searched on:
Author: bettye johnson

Displaying records 111 to 120 of 162 records.
Resort by: Date / Title


111. Initial Results of the Bidirectional Reflectance Characterization Round-Robin in Support of EOS
Published: 10/1/1998
Authors: Bettye C Johnson, P Y. Barnes, Thomas R. O'Brian, James J. Butler, C J Bruegge, S F Biggar, P R Spyak, M M Pavlov
Abstract: Laboratory measurements of the bidirecitonal reflectance distribution function (BRDF) of diffusely reflecting samples are required to support calibration in the National Aeronautics and Space Administration's (NASA's) Earth Observing System (EOS) pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841253

112. Short-Term Stability Measurements of a Germanium Plotodiode Radiometer
Published: 10/1/1998
Authors: G Andor, Bettye C Johnson
Abstract: This paper describes a general stability measurement method for the short term stability, or repeatability, for radiometers using fixed-point blackbodies [BBs] as radiation sources. A germanium photodiode was used for the detector in the radiometer. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841235

113. The 1996 North American Interagency Intercomparison of Ultraviolet Monitoring Spectroradiometers
Series: Journal of Research (NIST JRES)
Published: 9/1/1998
Authors: E A Thompson, Bettye C Johnson, P Disterhoft, D Wardle, E Wu, J Ehramjian, J Tusson, T Mestechkina, M Beaubian, J Gibson, D Hayes, J DeLuisi, E A. Early, W Mou
Abstract: Concern over stratospheric ozone depletion has prompted several government agencies in North America to establish networks of spectroradiometers for monitoring solar ultraviolet irradiance at the surface of the Earth. To assess the ability of spectr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841984

114. Radiometric and Engineering Performance of the SeaWiFS Quality Monitor (SQM): A Portable Light Source for Field Radiometers
Published: 8/1/1998
Authors: Bettye C Johnson, Ping-Shine Shaw, S B. Hooker, D C Lynch
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103899

115. A 400 nm to 2500 nm Absolute Spectral Radiance Comparison using Filter Radiometers
Published: 1/1/1998
Authors: Howard W Yoon, Bettye C Johnson, D Kelch, S F Biggar, P R Spyak
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104277

116. Description of a portable spectroradiometer to validate EOS radiance scales in the shortwave infrared
Published: 1/1/1998
Authors: W W Brown, Bettye C Johnson, W Yoon h
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101361

117. Initial Results of the Bidirectional Reflectance Characterization Round-Robin in Support of EOS AM-1
Published: 1/1/1998
Authors: Bettye C Johnson, Thomas R. O'Brian, P Y. Barnes, E A. Early, James J. Butler, C J Bruegge, S F Biggar, P R Spyak, M M Pavlov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103900

118. Radiometric Traceability for Fundamental Measurements: Estimation and Evaluation of Combined Standard Uncertainties
Published: 1/1/1998
Authors: Benjamin K Tsai, Bettye C Johnson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104231

119. Short Term Stability Measurements of a Germanium Photodiode Radiometer
Published: 1/1/1998
Authors: G Andor, Bettye C Johnson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100965

120. The NIST EOS Thermal-infrared Transfer Radiometer
Published: 1/1/1998
Authors: Joseph Paul Rice, Bettye C Johnson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104139



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series