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Author: howard harary
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1. Proceedings of a NIST Internal Workshop on Non-Contact Thermometry
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6572
Published: 1/1/2000
Author: Howard H. Harary
Abstract: This report collects the executive summaries and visual of twenty-two presentations from an internal workshop on non-contract thermometry at NIST. The workshop took place on April 14, 2000, at NIST in Gaithersburg, Maryland, and was video-conferenced ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823132

2. Technical Directions of the NIST Precision Engineering Division: 1997-2001
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6218
Published: 1/1/1998
Authors: Dennis A Swyt, Howard H. Harary, Michael T Postek, Richard M Silver, Theodore Vincent Vorburger
Abstract: This report, based on U.S. industry roadmaps and related National Institute of Standards and Technology studies, is a product of the process of strategic planning for the NIST Precision Engineering Division (PED) and presents the major technological ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820917

3. Some Considerations for a Measurement Strategy for Circular Features
Published: 1/1/1994
Authors: Howard H. Harary, C Buchard, P L heritier, J Dufraigne, P Chollet
Abstract: The careful study of manufactured parts is a prerequisite for their intelligent inspection. For this study, we conducted a survey of the processes for making holes by manufacturing a set of test parts using ten different machining processes. The hole ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820683

4. U.S. Navy Coordinate Measuring Machines: A Study of Needs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5379
Published: 1/1/1994
Authors: David C Stieren, Ralph C. Veale, Howard H. Harary, Shaw C Feng
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820716

5. Imaging of Passivated III-V Semiconductor Surfaces by a Scanning Tunneling Microscope Operating in Air
Published: 12/31/1992
Authors: John A Dagata, W. F. Tseng, J. Bennett, J. Schneir, Howard H. Harary
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15157

6. Integration of Scanning Tunneling Microscope Nanolithography and Electronics Device Processing
Published: 8/1/1992
Authors: John A Dagata, W. F. Tseng, J. Bennett, E. A. Dobisz, J. Schneir, Howard H. Harary
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22118

7. STM Pattern Generation on Silicon and GaAs Surfaces
Published: 12/31/1991
Authors: John A Dagata, J. Schneir, Howard H. Harary, C J Evans, Michael T Postek, J. Bennett, W. F. Tseng
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9638

8. P^d2^S^d5^ Passivation of GaAs Surfaces for Scanning Tunneling Microscopy in Air
Published: 12/16/1991
Authors: John A Dagata, W. F. Tseng, J. Bennett, J. Schneir, Howard H. Harary
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20412

9. Nanolithography on III-V Semiconductor Surfaces Using a Scanning Tunneling Microscope Operating in Air
Published: 10/1/1991
Authors: John A Dagata, W. F. Tseng, J. Bennett, J. Schneir, Howard H. Harary
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9017

10. Pattern Generation on Semiconductor Surfaces by a Scanning Tunneling Microscope Operating in Air
Published: 4/1/1991
Authors: John A Dagata, J. Schneir, Howard H. Harary, J. Bennett, W. F. Tseng
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11219



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