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Displaying records 51 to 60 of 67 records.
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51. Nanoscale Chemical Imaging of Polymeric Materials With Atomic Force Microscopy
Published: 2/26/2003
Authors: Xiaohong Gu, Tinh Nguyen, Michael J Fasolka, D Julthongpiput, Lei Chen, Mark R VanLandingham, Y C Jean, Jonathan W. Martin
Abstract: Nanoscale spatial chemical information is essential to developing a molecular-level understanding of a variety of phenomena occurring at surfaces and interfaces, including adhesion, friction, and surface reactivity. Therefore, the ability to probe an ...

52. Near-Field Optical Imaging of Microphase Separated and Semi-Crystalline Polymer Systems
Published: 1/1/2002
Authors: Michael J Fasolka, Lori S. Goldner, A Urbas, Jeeseong Hwang, Kathryn L Beers, P DeRege, Evan L. Thomas
Abstract: Polymer self-assembly presents an attractive means of creating the micro- and nano-patterned spatial arrays required for many opto-electronic and coatings technologies. Two of these ordering processes are microphase separation (MS), exhibited by blo ...

53. Near-Field Polarimetric Characterization of Polymer Crystallites
Published: 8/1/2004
Authors: Lori S. Goldner, S N Goldie, Michael J Fasolka, F Renaldo, Jeeseong Hwang, Jack F Douglas
Abstract: We use near-field polarimetry (NFP) to investigate thin film crystallites of isotactic polystyrene (iPS). NFP micrographs enabled quantitative optical characterization of the birefringence in these specimens with sub-diffraction limited resolution, ...

54. Near-Field Polarimetric Characterization of Semi-Crystalline Polymer Systems
Published: 3/1/2003
Authors: S N Goldie, Michael J Fasolka, Lori S. Goldner, Jeeseong Hwang, Kathryn L Beers
Abstract: We have studied crystallization in thin films of isotactic polystyrene (iPS) to better understand the morphology and formation of these structures through the use of polarization modulation near-field scanning optical microscopy (PM-NSOM). Polymer cr ...

55. Newton's Rings in Near-Field Optics
Published: 1/1/2001
Authors: Lori S. Goldner, Jeeseong Hwang, Garnett W Bryant, Michael J Fasolka, P Absil, J V Hryniewicz, F G Johnson, H Shen, P T Ho
Abstract: We show how Newton's rings manifest themselves in near-field scanning optical microscopy and discuss how this effect can be used with topographic imaging to measure correlated roughness of thin films. In conventional optics, transmission through a th ...

56. Pattern-Directed to Isotropic Dewetting Transition in Polymer Films on Micropatterned Surfaces With Differential Surface Energy Contrast
Published: 1/1/2007
Authors: D Julthongpiput, Wenhua Zhang, Jack F Douglas, Alamgir Karim, Michael J Fasolka

57. Pattern-directed to isotropic dewetting transition in polymer films on micropatterned surfaces with differential surface energy contrast
Published: 1/27/2007
Authors: D Julthongpiput, Wenhua Zhang, Jack F Douglas, Alamgir Karim, Michael J Fasolka
Abstract: Surface chemical patterns can both cause and direct dewetting in overlying thin films. However, a key factor in this behavior, the magnitude of surface energy differences between pattern domains ( ?g ), is largely unevaluated. To probe the effect o ...

58. Preparation of Combinatorial Arrays of Polymer Thin Films for Transmission Electron Microscopy Analysis
Published: 10/21/2008
Authors: Kristen Roskov, Thomas Epps, Brian Berry, Michael J Fasolka, Steven D Hudson, Maeva S. Tureau
Abstract: We present a new method for harvesting multiple thin film specimens from polymer combinatorial libraries for Transmission Electron Microscopy (TEM) analysis. Such methods are of interest to researchers who wish to integrate TEM measurements into a co ...

59. Quantifying Residual Stress in Nanoscale Thin Polymer Films via Surface Wrinkling
Published: 3/19/2009
Authors: Jun Y. Chung, Thomas Q. Chastek, Michael J Fasolka, Hyun Wook Ro, Christopher M Stafford
Abstract: Residual stress, a pervasive consequence of solid materials processing, is stress that remains in a material after external forces have been removed. In polymeric materials, residual stress results from processes, such as film formation, that force ...

60. Quantitative Subsurface Contact Resonance Force Microscopy of Model Polymer Nanocomposites
Published: 3/16/2011
Authors: Jason Philip Killgore, Jennifer Y. Kelly, Christopher M Stafford, Michael J Fasolka, Donna C. Hurley
Abstract: We present experimental results on the use of quantitative contact resonance force microscopy (CR-FM) for mapping the planar location and depth of 50 nm silica nanoparticles buried beneath polystyrene films 30 nm to 165 nm thick. The presence of sha ...

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