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Author: michael fasolka
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Displaying records 11 to 20 of 66 records.
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11. Combinatorial Materials Science: Measures of Success
Published: 1/30/2007
Authors: Michael J Fasolka, Eric J. Amis
Abstract: points across parameter space. When designed effectively, combinatorial libraries explore a range of parameters in a rational and reliable manner. Second, where traditional experiments test and analyze samples in a one at a time mode, combinatori ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852702

12. Combinatorial Materials Synthesis and High-Throughput Characterization
Published: 10/1/2005
Authors: Ichiro Takeuchi, Lauterbach Jochen, Michael J Fasolka
Abstract: The pace at which major technological changes take place is often dictated by the rate at which new materials are discovered, and timely arrival of new materials has always played a key role in bringing advances to our society. There is no wonder the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852559

13. Combinatorial Methods Study of Confinement Effects on the Reaction Front in Ultrathin Chemically Amplified Photoresists
Published: 1/1/2003
Authors: M Wang, Eric K Lin, Alamgir Karim, Michael J Fasolka
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853895

14. Combinatorial screening of the effect of temperature on the microstructure and mobility of a high performance polythiophene semiconductor
Published: 1/1/2007
Authors: Leah A. Lucas, Dean M DeLongchamp, Brandon M. Vogel, Eric K Lin, Michael J Fasolka, Daniel A Fischer, Iain McCulloch, Martin Heeney, Ghassan Jabbour
Abstract: Using a gradient combinatorial approach, the authors report the effects of temperature on the microstructure and hole mobility of poly2,5-bis3-dodecylthiophen-2ylthieno3,2-bthiophene thin films for application in organic field-effect transist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852694

15. Combinatorial screening of the effect of temperature on the microstructure and mobility of a high performance polythiophene semiconductor
Published: 9/26/2007
Authors: Leah A. Lucas, Dean M DeLongchamp, Brandon M. Vogel, Eric K Lin, Michael J Fasolka, Daniel A Fischer, Iain McCulloch, Martin Heeney, Ghassan E Jabbour
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854408

16. Effect of Block Thickness on Solvent Response of Block Copolymer Brushes: A Combinatorial Study With Block Copolymer Brush Gradients
Published: 3/1/2006
Authors: Chang Xu, Tao Wu, Charles M Drain, J Batteas, Michael J Fasolka, Kathryn L Beers
Abstract: Block copolymer (BC) brush gradient libraries were explored as high-throughput platforms to study the effect of relative block thickness on the BC response to solvent. BC brushes of n-butyl methacrylate (BMA) and 2-(N,N-dimethylamino)ethyl methacryla ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852503

17. Effects of Surface Functionality and Humidity on The Adhesion Force and Chemical Contrast Measured With AFM
Published: 1/1/2005
Authors: Tinh T. Nguyen, Xiaohong Gu, lijiang chen, Michael J Fasolka, Kimberly A Briggman, Jeeseong Hwang, Jonathan W. Martin
Abstract: The ability to probe chemical heterogeneity with nanometer scale resolution is essential for developing a molecular level understanding of a variety of phenomena occurring at surfaces of materials. One area that could benefit greatly from nanoscale ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104664

18. Enhancing Sensitivity of Atomic Force Microscopy for Characterization ofSurface Chemical Heterogeneity
Published: Date unknown
Authors: Xiaohong Gu, Tinh T. Nguyen, Michael J Fasolka, Mark R VanLandingham, Jonathan W. Martin
Abstract: Atomic force microscopy (AFM) has played an increasingly important role in characterizing surface morphology and surface properties of materials. However, the ability to identify and map the surface chemical heterogeneity has remained an unfulfilled ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860524

19. Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity
Published: 1/1/2003
Authors: Xiaohong Gu, Mark R VanLandingham, Michael J Fasolka, Jonathan W. Martin, J Y Jean, Tinh T. Nguyen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853857

20. Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity
Published: 2/26/2003
Authors: Xiaohong Gu, Mark R VanLandingham, Michael J Fasolka, Jonathan W. Martin, J Y Jean, Tinh T. Nguyen
Abstract: In this study, a well-controlled humidity system is used to enhance the sensitivity of A-FM in characterizing surface chemical heterogeneity. The relative humidity of the tip-sample environment is controlled using a humidity generator and a novel sm ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860482



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