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Author: michael fasolka
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61. Techniques for Combinatorial and High-Throughput Microscopy. Part 1: Gradient Specimen Fabrication for Polymer Thin Films Research
A Sehgal, Alamgir Karim, Christopher M Stafford, Michael J Fasolka
Combinatorial and high-throughput (C&HT) approaches accelerate research by addressing multiple experimental parameters in a parallel highly efficient fashion. As with traditional materials science, microscopy and imaging of morphology are essential ...
62. Near-Field Optical Imaging of Microphase Separated and Semi-Crystalline Polymer Systems
Michael J Fasolka, Lori S. Goldner, A Urbas, Jeeseong Hwang, Kathryn L Beers, P DeRege, Evan L. Thomas
Polymer self-assembly presents an attractive means of creating the micro- and nano-patterned spatial arrays required for many opto-electronic and coatings technologies. Two of these ordering processes are microphase separation (MS), exhibited by blo ...
63. Block Copolymer Thin Films: Physics and Applications
Michael J Fasolka, A M Mayes
A two-part review of research concerning block copolymer thin films is presented. The first section summarizes experimental and theoretical studies of the fundamental physics of these systems, concentrating upon the forces that govern film morpholog ...
64. Newton's Rings in Near-Field Optics
Lori S. Goldner, Jeeseong Hwang, Garnett W Bryant, Michael J Fasolka, P Absil, J V Hryniewicz, F G Johnson, H Shen, P T Ho
We show how Newton's rings manifest themselves in near-field scanning optical microscopy and discuss how this effect can be used with topographic imaging to measure correlated roughness of thin films. In conventional optics, transmission through a th ...
65. Enhancing Sensitivity of Atomic Force Microscopy for Characterization ofSurface Chemical Heterogeneity
Xiaohong Gu, Tinh T. Nguyen, Michael J Fasolka, Mark R VanLandingham, Jonathan W. (Jonathan W.) Martin
Atomic force microscopy (AFM) has played an increasingly important role in characterizing surface morphology and surface properties of materials. However, the ability to identify and map the surface chemical heterogeneity has remained an unfulfilled ...
66. Interaction of Surface Free Energy and Humidity on AFM Tip-Sample Adhesion Measured by Chemical Force Microscopy
Lei Chen, Tinh T. Nguyen, Xiaohong Gu, D Julthongpiput, Michael J Fasolka, Jonathan W. (Jonathan W.) Martin