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Author: michael fasolka

Displaying records 41 to 50 of 66 records.
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41. Near-Field Polarimetric Characterization of Polymer Crystallites
Published: 8/1/2004
Authors: Lori S. Goldner, S N Goldie, Michael J Fasolka, F Renaldo, Jeeseong Hwang, Jack F Douglas
Abstract: We use near-field polarimetry (NFP) to investigate thin film crystallites of isotactic polystyrene (iPS). NFP micrographs enabled quantitative optical characterization of the birefringence in these specimens with sub-diffraction limited resolution, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841784

42. Gradient Reference Specimens for Advanced Scanned Probe Microscopy
Published: 7/1/2004
Authors: D Julthongpiput, Michael J Fasolka, Eric J. Amis
Abstract: Recent years have seen the emergence of a new generation of SPM techniques, which intend to measure chemical, mechanical, and electro/optical properties on the nanoscale. Currently, these techniques provide qualitative (or semi-quantitative) data, o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852335

43. An Open Source Informatics System for Combinatorial Materials Research
Published: 3/1/2004
Authors: Weiping Zhang, Michael J Fasolka, Alamgir Karim, Eric J. Amis
Abstract: Laboratory Research Informatics Systems (LRIS) hold great promise in streamlining research generally, and are particularly necessary for new data-intensive research strategies such as combinatorial and high-throughput approaches. In this talk, we des ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852283

44. High Throughput Measurement of the Elastic Modulus of Polymer Thin Films
Published: 2/1/2004
Authors: Christopher M Stafford, A Chiche, D Julthongpiput, Michael J Fasolka
Abstract: Combinatorial and High Throughput (C&HT) methods combine clever experiment design, instrument automation, and computing tools to form a new paradigm for scientific research. Given this premise, the C&HT concept is being adapted to study problems in m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852342

45. Informatics Infrastructure for Combinatorial and High-Throughput Laboratory Research Built on Open Source Code
Published: 2/1/2004
Authors: Wenhua Zhang, Michael J Fasolka, Alamgir Karim, Eric J. Amis
Abstract: Laboratory Research Informatics Systems (LRIS) hold great promise in streamlining research generally, and are particularly necessary for new data-intensive research strategies such as combinatorial and high-throughput approaches. In this paper, we de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852355

46. Micropatterning of Organosilane Self-Assembled Monolayers with Gradient Surfaces for Advanced SPM Nanometrology
Published: 2/1/2004
Authors: D Julthongpiput, Michael J Fasolka
Abstract: We present a new class of micropatterning techniques that incorporates a surface energy gradient on a single substrate. By combining microcontact printing and vapor deposition methods, this technique provides fast, reproducible, and high-quality micr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852334

47. Advanced Techniques for Nanocharacterization of Polymeric Coating Surfaces
Published: 1/1/2004
Authors: X H Gu, T Y Wu, Tinh Nguyen, Li Piin Sung, Mark R VanLandingham, Michael J Fasolka, Jonathan W. Martin, Y C Jean, D Nguyen, N K Chang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853954

48. Gradient Reference Surfaces for Scanning Probe Microscopy
Published: 1/1/2004
Authors: Michael J Fasolka, D Julthongpiput, Kimberly A Briggman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853922

49. High-Throughput Craze Studies in Gradient Thin Films Using Ductile Copper Grids
Published: 1/1/2004
Authors: A J Crosby, Michael J Fasolka, Kathryn L Beers
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852295

50. Mapping Chemical Heterogeneity of Polymeric Materials with Chemical Force Microscopy
Published: 1/1/2004
Authors: Tinh Nguyen, Xiaohong Gu, Michael J Fasolka, Kimberly A Briggman, Jeeseong Hwang, Alamgir Karim, Jonathan W. Martin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853919



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