NIST logo

Publications Portal

You searched on: Author: jack douglas Sorted by: date

Displaying records 191 to 200 of 227 records.
Resort by: Date / Title

191. Mean-Field-Scaling in Lattice Boltzmann Fluid Mixtures
Published: 6/1/1999
Authors: Nicos Martys, Jack F Douglas
Abstract: Basic equilibrium properties of Lattice Boltzmann (LB) fluid mixtures (coexistence curve, surface tension, and interfacial profile) are calculated to characterize the critical phenomena occurring in these model liquids and to establish a reduced vari ...

192. Dynamic Entropy as a Measure of Caging and Persistent Particle Motion in Supercooled Liquids
Published: 1/1/1999
Authors: P Allegrini, Jack F Douglas, S C Glotzer

193. Excitation of Surface Deformation Modes of a Phase Separating Polymer Blend on a Patterned Substrate
Published: 1/1/1999
Authors: G Nisato, B D Ermi, Jack F Douglas, Alamgir Karim
Abstract: The phase separation kinetics of ultrathin deuterated poly(styrene)/poly(butadiene) polymer blend films spun cast onto striped self-assembled monolayer (SAM) substrates is studied by atomic force microscopy (AFM). Fourier transform analysis of the A ...

194. Frustrated Coalescence in a Chemically Reactive Polymer Blend Film
Published: 1/1/1999
Authors: Alamgir Karim, Jack F Douglas, Sushil K. Satija, Charles C. Dr. Han, R J Goyette

195. Integral Equation Approach to Condensed Matter Relaxation
Published: 1/1/1999
Author: Jack F Douglas
Abstract: A model of relaxation in supercooled and polymer liquids is developed starting from an integral equation describing relaxation in liquids near thermal equilibrium and probabilistic modeling of the dynamic heterogeneity presumed to occur in these comp ...

196. Model for the Viscosity of Particle Dispersions
Published: 1/1/1999
Authors: J Bicerano, Jack F Douglas, D A Brune

197. Spinodal Dewetting of Thin Polymer Films
Published: 8/1/1998
Authors: R H Xie, Alamgir Karim, Jack F Douglas, Charles C. Dr. Han, Robert A Weiss
Abstract: Dewetting of polystyrene (PS) films on a silicon substrate is investigated as a function of film thickness, h. We observe the nucleation of holes in the early stage of dewetting for relatively thick films (h > 100 {Angstrom}), as observed previously, ...

198. Preparation and Characterization of Polymer/Dendrimer Blends Progress Report 2/24/97
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6183
Published: 6/1/1998
Authors: Eric J. Amis, Barry J. Bauer, F I Groehn, T J. Prosa, Da-Wei Liu, K A Barnes, C L. Jackson, B D Viers, Alamgir Karim, Jack F Douglas
Abstract: Dendrimer, dendrigraft, and hyperbranched solutions, blends, and interpenetrating polymer networks are characterized by small neutron and x-ray scattering, reflectivity, atomic force microscopy, and transmission electron microscopy.

199. NIST Meeting on Multicomponent Polymers and Polyelectrolytes
Series: Journal of Research (NIST JRES)
Published: 3/1/1998
Author: Jack F Douglas
Abstract: A joint meeting was held between the NIST Polymer Blends and Processing Group and ERATO. The purpose of the conference was to review progress made by the NIST and ERATO groups in experimental and theoretical aspects of phase separation in polymer bl ...

200. Colliding Self-Assembly Waves in Organosilane Monolayers
Published: Date unknown
Authors: K Efimenko, Ali Ozcam, Jan Genzer, Daniel A Fischer, Frederick R Phelan Jr., Jack F Douglas
Abstract: Colliding autocatalytic wave-fronts of organosilane (OS) layer self-assembly are generated through the controlled positioning of sources of the volatile OS material at the edges of a silica wafer and through adjustment of the container dimensions in ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series