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Displaying records 71 to 80 of 81 records.
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71. Tomography of Integrated Circuit Interconnect With an Electromigration Void
Published: 5/1/2000
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: An integrated circuit interconnect was subject to accelerated-life conditions to induce an electromigration void. The silicon substrate was removed, leaving only the interconnect encased test structure encased in silica. We imaged the sample wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840087

72. Tomography of Integrated Circuit Interconnects
Published: 10/1/2001
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: 00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840113

73. UV Radiometry with Synchrotron Radiation and Cryogenic Radiometry,
Published: 1/1/1999
Authors: Ping-Shine Shaw, Keith R Lykke, R Gupta, Thomas R. O'Brian, Uwe Arp, H H White, Thomas B Lucatorto, J L Dehmer, Albert C Parr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101716

74. UV and VUV radiometry programs at the Synchrotron Ultraviolet Radiation Facility (SURF III)
Published: 1/1/2006
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103972

75. UV radiometry using synchrotron radiation and absolute cryogenic radiometry
Published: 1/1/1999
Authors: Ping-Shine Shaw, Keith R Lykke, R Gupta, Thomas R. O'Brian, Uwe Arp, H H White, Thomas B Lucatorto, J L Dehmer, Albert C Parr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104742

76. Ultraviolet Characterization of Integrating Spheres
Published: 7/9/2007
Authors: Ping-Shine Shaw, Zhigang Li, Uwe Arp, Keith R Lykke
Abstract: We have studied the performance of integrating spheres in the ultraviolet (UV) with wavelengths as short as 200 nm. Two techniques were used for this study; first, the spectral throughput of an integrating sphere irradiated by a deuterium lamp was an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841052

77. Uniform and enhanced field emission from chromium oxide coated carbon nanosheets
Published: 4/2/2008
Authors: Uwe Arp, Kun Hou, Ronald Outlaw, Wang Sigen, Mingyao Zhu, Ronald Quinlan, Dennis Manos, Martin Kordesch, Brian Holloway
Abstract: Carbon nanosheets, a two-dimensional carbon nanostructure, are promising electron cathode materials for applications in vacuum microelectronic devices. This letter demonstrates a simple approach to improve the spatial emission uniformity of carbon na ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903061

78. Upgrades to the NIST/DARPA EUV Reflectometry Facility
Published: 12/1/2001
Authors: Charles S Tarrio, Thomas B Lucatorto, S Grantham, M B. Squires, Uwe Arp, Lu Deng
Abstract: We have recently installed a new sample chamber at the NIST/DARPA EUV Reflectometry Facility at the National Institute of Standards and Technology. The chamber replaces a much smaller system on Beamline 7 at the Synchrotron Ultraviolet Radiation Fac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841579

79. X-Ray Fluorescence/Auger-electron Coincidence Spectroscopy of Atomic Argon
Published: 1/1/1997
Authors: Uwe Arp, T Lebrun, S H Southworth, M A Macdonald, M Jung
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101899

80. X-ray Fluorescence and Auger-Electron Coincidence Spectroscopy of Vacancy Cascades in Atomic Argon
Published: 1/1/1997
Authors: Uwe Arp, T Lebrun, S H Southworth, M A Macdonald, M Jung
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101374



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