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Displaying records 61 to 70 of 74 records.
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61. The New Beamline 3 at SURF III for Source-Based Radiometry
Published: 3/1/2002
Authors: Ping-Shine Shaw, D A Shear, R Stamilio, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
Abstract: The Synchrotron Ultraviolet RAdiation Facility (SURF III) at the National Institute of Standards and Technology provides a unique opportunity for high-accuracy UV to infrared radiometry due to the 70-fold improvement in the uniformity of the magnetic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841601

62. The New UV Radiometry Facility at SURF
Published: 3/1/2002
Authors: Ping-Shine Shaw, Keith R Lykke, R Gupta, Uwe Arp, Thomas B Lucatorto, Albert C Parr
Abstract: The Synchrotron Ultraviolet Radiation Facility (SURF III) at the National Institute of Standards and Technology (NIST) provides a unique opportunity for high-accuracy VUV to visible radiometry with the completion of a recent upgrade to improve the un ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841980

63. The new beamline 3 at SURF III for source-based radiometry,
Published: 1/1/2002
Authors: Ping-Shine Shaw, D A Shear, R J Stamilio, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101713

64. Tomography of Integrated Circuit Interconnect With an Electromigration Void
Published: 5/1/2000
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: An integrated circuit interconnect was subject to accelerated-life conditions to induce an electromigration void. The silicon substrate was removed, leaving only the interconnect encased test structure encased in silica. We imaged the sample wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840087

65. Tomography of Integrated Circuit Interconnects
Published: 10/1/2001
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: 00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840113

66. UV Radiometry with Synchrotron Radiation and Cryogenic Radiometry,
Published: 1/1/1999
Authors: Ping-Shine Shaw, Keith R Lykke, R Gupta, Thomas R. O'Brian, Uwe Arp, H H White, Thomas B Lucatorto, J L Dehmer, Albert C Parr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101716

67. UV and VUV radiometry programs at the Synchrotron Ultraviolet Radiation Facility (SURF III)
Published: 1/1/2006
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103972

68. UV radiometry using synchrotron radiation and absolute cryogenic radiometry
Published: 1/1/1999
Authors: Ping-Shine Shaw, Keith R Lykke, R Gupta, Thomas R. O'Brian, Uwe Arp, H H White, Thomas B Lucatorto, J L Dehmer, Albert C Parr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104742

69. Ultraviolet Characterization of Integrating Spheres
Published: 7/9/2007
Authors: Ping-Shine Shaw, Zhigang Li, Uwe Arp, Keith R Lykke
Abstract: We have studied the performance of integrating spheres in the ultraviolet (UV) with wavelengths as short as 200 nm. Two techniques were used for this study; first, the spectral throughput of an integrating sphere irradiated by a deuterium lamp was an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841052

70. Uniform and enhanced field emission from chromium oxide coated carbon nanosheets
Published: 4/2/2008
Authors: Uwe Arp, Kun Hou, Ronald Outlaw, Wang Sigen, Mingyao Zhu, Ronald Quinlan, Dennis Manos, Martin Kordesch, Brian Holloway
Abstract: Carbon nanosheets, a two-dimensional carbon nanostructure, are promising electron cathode materials for applications in vacuum microelectronic devices. This letter demonstrates a simple approach to improve the spatial emission uniformity of carbon na ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903061



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