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Displaying records 61 to 70 of 80 records.
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61. Sulfer-K^d[beta]^ X-Ray Emission From Carbonyl Sulfide: Variations With Polarization and Excitation Energy at the S-K Threshold
Published: 4/1/1998
Authors: K E Miyano, Uwe Arp, S H Southworth, T E Meehan, T R Walsh, F P Larkins
Abstract: Sulfur-K^d[beta]^ x-ray emission spectra from carbonyl sulfide (OCS) have been measured with resonant excitation at the sulfur K absorption threshold and compared with results of [Delta]SCF and [Delta]DCI calculations. For excitation to the strong 4 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840046

62. Sulfur K{beta} X-Ray Emission from Carbonyl Sulfide: Variations with Polarization and Excitation Energy at the S-K Threshold,
Published: 1/1/1998
Authors: K E Miyano, Uwe Arp, S H Southworth, T E Meehan, T R Walsh, F P Larkins
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101635

63. Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III
Published: 1/1/2007
Authors: Uwe Arp, Charles E Gibson, Keith R Lykke, Albert C Parr, Robert D. Saunders, D J Shin, Ping-Shine Shaw, Zhigang Li, Howard W Yoon
Abstract: A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841022

64. Synchrotron Ultraviolet Radiation Facility SURF III
Published: 3/1/2002
Authors: Uwe Arp, Charles W Clark, Alex P. Farrell, E Fein, Mitchell L. Furst, Edward W Hagley
Abstract: The National Institute of Standards and Technology (NIST) has operated the Synchrotron Ultraviolet Radiation Facility (SURF) continuously since the early 1960s. The original accelerator was converted into a storage ring, called SURF II, in 1974. Then ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840122

65. Synchrotron ultraviolet radiation facility SURF III
Published: 1/1/2002
Authors: Uwe Arp, Charles W Clark, Alex P. Farrell, E Fein, Mitchell L. Furst, Edward W Hagley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101027

66. The New Beam line 3 at SURF III for Source-Base Radiometry
Published: 1/1/2002
Authors: Ping-Shine Shaw, D A Shear, R Stamilio, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104741

67. The New Beamline 3 at SURF III for Source-Based Radiometry
Published: 3/1/2002
Authors: Ping-Shine Shaw, D A Shear, R Stamilio, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
Abstract: The Synchrotron Ultraviolet RAdiation Facility (SURF III) at the National Institute of Standards and Technology provides a unique opportunity for high-accuracy UV to infrared radiometry due to the 70-fold improvement in the uniformity of the magnetic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841601

68. The New UV Radiometry Facility at SURF
Published: 3/1/2002
Authors: Ping-Shine Shaw, Keith R Lykke, R Gupta, Uwe Arp, Thomas B Lucatorto, Albert C Parr
Abstract: The Synchrotron Ultraviolet Radiation Facility (SURF III) at the National Institute of Standards and Technology (NIST) provides a unique opportunity for high-accuracy VUV to visible radiometry with the completion of a recent upgrade to improve the un ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841980

69. The new beamline 3 at SURF III for source-based radiometry,
Published: 1/1/2002
Authors: Ping-Shine Shaw, D A Shear, R J Stamilio, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101713

70. Tomography of Integrated Circuit Interconnect With an Electromigration Void
Published: 5/1/2000
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: An integrated circuit interconnect was subject to accelerated-life conditions to induce an electromigration void. The silicon substrate was removed, leaving only the interconnect encased test structure encased in silica. We imaged the sample wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840087



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