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Displaying records 21 to 30 of 76 records.
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21. Elimation of Intensity Noise at SURF III
Published: 8/1/2001
Authors: Uwe Arp, K Harkay, K Kim, Thomas B Lucatorto
Abstract: Most applications of synchrotron radiation are not very sensitive to source intensity fluctuations. Fourier-transform spectroscopy, however, is very sensitive to intensity noise with frequencies of few Hz to several kHz. An infrared spectrometer in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841535

22. First Report on Quantum Dot Coated CMOS CID Arrays for the UV and VUV
Published: 12/13/2013
Authors: Uwe Arp, Robert Edward Vest, Zoran Ninkov, Ross Robinson, Suraj Bhaskaran
Abstract: A technique has been developed for coating commercial off the shelf (COTS) detector arrays with a thin, uniform layer of quantum dots. The quantum deposition is accomplished using an Optomec Aerosol Jet rapid prototyping system. When illuminated by U ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914748

23. Forty Years of Metrology with Synchrtron Radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100995

24. Forty years of metrology with synchrotron radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100997

25. Improvements to the NIST/DARPA EUV Reflectometry Facility
Published: 1/1/2001
Authors: Charles S Tarrio, Thomas B Lucatorto, S Grantham, M B Squires, Uwe Arp, Lu Deng
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100201

26. Influence of the Vertical Emittance on the Calculability of the Synchrotron Ultraviolet Radiation Facility
Published: 1/1/2002
Author: Uwe Arp
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101018

27. Influence of the Vertical Emittance on the Calculability of the Synchrotron Ultraviolet Radiation Facility
Series: Journal of Research (NIST JRES)
Published: 10/1/2002
Author: Uwe Arp
Abstract: A method to include the influence of the vertical electron beam emittance onto the calculability of synchrotron radiation is introduced. It accounts for the finite vertical size and angular spread of the electron beam through a convolution procedure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840148

28. Long-Term Monitoring of the Ultraviolet Irradiance Scale at the Facility for Irradiance Calibration Using Synchrotrons
Published: 6/18/2010
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Charles E Gibson, Howard W Yoon, Keith R Lykke
Abstract: In 2004, the National Institute of Standards and Technology (NIST) established the ultraviolet (UV) spectral irradiance scale from 200 nm to 400 nm using the calculable irradiance of the Synchrotron Ultraviolet Radiation Facility (SURF). Since the es ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904737

29. Measurement of the ultraviolet-induced fluorescence yield from integrating spheres
Published: 6/2/2009
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
Abstract: We report theory and measurements of a simple and absolute technique for the determination of the total emitted spectral fluorescence yield inside an integrating sphere from the sphere coating under irradiation with a monochromatic beam. This techniq ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842602

30. Measuring Nondipolar Asymmetries of Photoelectron Angular Distributions
Published: 1/1/1996
Authors: Ping-Shine Shaw, Uwe Arp, U, S H Southworth
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102497



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