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Displaying records 11 to 20 of 77 records.
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11. Bilateral NIST-PTB Comparison of Spectral Responsivity in the VUV
Published: 1/20/2011
Authors: Uwe Arp, Ping-Shine Shaw, Zhigang Li, Alexander Gottwald, Mathias Richter
Abstract: To compare the calibration capabilities for the spectral responsivity in the vacuum-ultraviolet spectral region between 135 nm and 250 nm, PTB and NIST agreed on a bilateral comparison. Calibrations of semiconductor photodiodes as transfer detectors ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905153

12. Characterisation of the Response of Chromium-Doped Alumina Screens in the Vacuum Ultraviolet Using Synchrotron Radiation
Published: 12/1/2002
Authors: James K McCarthy, A Baciero, B Zurro, Uwe Arp, Charles S Tarrio, Thomas B Lucatorto, A Morono, P Martin, E R Hodgson
Abstract: We have measured the response of chromium-doped alumina screens to vacuum ultraviolet radiation and derived quantum efficiency curves for the energy range from 30 to 300 eV. A model is presented to explain the structure in this curve. In addition, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840027

13. Characterization of Materials Using an Ultraviolet Radiometric Beamline at SURF III
Published: 1/1/2000
Authors: Ping-Shine Shaw, R Gupta, Thomas Avery Germer, Uwe Arp, Thomas B Lucatorto, Keith R Lykke
Abstract: The completion of the upgrade of the synchrotron facilities at the National Institute of Standards and Technology (NIST) has yielded a better-characterization broadband source of ultraviolet (UV) radiation at the Synchrotron Ultraviolet Radiation Fa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841389

14. Characterization of Materials using UV Radiometric Beamline at SURF III
Published: 1/1/2000
Authors: Ping-Shine Shaw, R Gupta, Thomas Avery Germer, Uwe Arp, Thomas B Lucatorto, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104166

15. Characterization of materials using an ultraviolet radiometric beamline at SURF III,
Published: 1/1/2000
Authors: Ping-Shine Shaw, R Gupta, Thomas Avery Germer, Uwe Arp, Thomas B Lucatorto, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101715

16. Characterization of the Coherent Microwave Emission From the Surf II Synchrotron Storage Ring
Published: 7/1/1997
Authors: Gerald T Fraser, Angela R Hight Walker, Thomas B Lucatorto, Uwe Arp, K. K. Lehmann
Abstract: The temporal profile and frequency spectrum of the microwave emission from the Synchrotron Ultraviolet Radiation Facility [SURF II] electron storage ring at the National Institute of Standards and Technology have been studied to access the utility of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841229

17. Characterization of the response of chromium-doped alumina screens in the vacuum ultraviolet using synchrotron radiation,
Published: 1/1/2002
Authors: James K McCarthy, A Baciero, B Zurro, Uwe Arp, Charles S Tarrio, Thomas B Lucatorto, A Morono, P Martin, E R Hodgson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101617

18. Damage to Solid-State Photodiodes by Vacuum Ultraviolet Radiation
Published: 6/1/2005
Authors: Uwe Arp, Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We report experimental results on the stability of photodiodes obtained at three different wavelengths in the vacuum ultraviolet spectral region. Two of these experiments were based on radiation damage inflicted with excimer lasers at 193 nm and 157 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840194

19. Damage to solid-state photodiodes by vacuum ultraviolet radiation
Published: 1/1/2005
Authors: Uwe Arp, R Gupta, L R Lykke, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100986

20. Diffraction and Depths-of-Field Effects in Electron Beam Imaging at SURF III
Published: 4/1/2001
Author: Uwe Arp
Abstract: Imaging an electron beam with visible light is a common method of diagnostics applied to electron accelerators. It is a straightforward way to deduce the transverse electron distribution as well as its changes over time. The electrons stored in the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840096



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