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11. Characterization of Materials Using an Ultraviolet Radiometric Beamline at SURF III
Published: 1/1/2000
Authors: Ping-Shine Shaw, R Gupta, Thomas Avery Germer, Uwe Arp, Thomas B Lucatorto, Keith R Lykke
Abstract: The completion of the upgrade of the synchrotron facilities at the National Institute of Standards and Technology (NIST) has yielded a better-characterization broadband source of ultraviolet (UV) radiation at the Synchrotron Ultraviolet Radiation Fa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841389

12. Characterization of Materials using UV Radiometric Beamline at SURF III
Published: 1/1/2000
Authors: Ping-Shine Shaw, R Gupta, Thomas Avery Germer, Uwe Arp, Thomas B Lucatorto, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104166

13. Characterization of materials using an ultraviolet radiometric beamline at SURF III,
Published: 1/1/2000
Authors: Ping-Shine Shaw, R Gupta, Thomas Avery Germer, Uwe Arp, Thomas B Lucatorto, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101715

14. Characterization of the Coherent Microwave Emission From the Surf II Synchrotron Storage Ring
Published: 7/1/1997
Authors: Gerald T Fraser, Angela R Hight Walker, Thomas B Lucatorto, Uwe Arp, K. K. Lehmann
Abstract: The temporal profile and frequency spectrum of the microwave emission from the Synchrotron Ultraviolet Radiation Facility [SURF II] electron storage ring at the National Institute of Standards and Technology have been studied to access the utility of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841229

15. Characterization of the response of chromium-doped alumina screens in the vacuum ultraviolet using synchrotron radiation,
Published: 1/1/2002
Authors: James K McCarthy, A Baciero, B Zurro, Uwe Arp, Charles S. Tarrio, Thomas B Lucatorto, A Morono, P Martin, E R Hodgson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101617

16. Damage to Solid-State Photodiodes by Vacuum Ultraviolet Radiation
Published: 6/1/2005
Authors: Uwe Arp, Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We report experimental results on the stability of photodiodes obtained at three different wavelengths in the vacuum ultraviolet spectral region. Two of these experiments were based on radiation damage inflicted with excimer lasers at 193 nm and 157 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840194

17. Damage to solid-state photodiodes by vacuum ultraviolet radiation
Published: 1/1/2005
Authors: Uwe Arp, R Gupta, L R Lykke, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100986

18. Diffraction and Depths-of-Field Effects in Electron Beam Imaging at SURF III
Published: 4/1/2001
Author: Uwe Arp
Abstract: Imaging an electron beam with visible light is a common method of diagnostics applied to electron accelerators. It is a straightforward way to deduce the transverse electron distribution as well as its changes over time. The electrons stored in the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840096

19. Diffraction and depths-of-field effects in electron beam imaging at SURF III
Published: 1/1/2001
Author: Uwe Arp
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101284

20. Elimation of Intensity Noise at SURF III
Published: 8/1/2001
Authors: Uwe Arp, K Harkay, K Kim, Thomas B Lucatorto
Abstract: Most applications of synchrotron radiation are not very sensitive to source intensity fluctuations. Fourier-transform spectroscopy, however, is very sensitive to intensity noise with frequencies of few Hz to several kHz. An infrared spectrometer in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841535