NIST logo

Publications Portal

You searched on:
Author: uwe arp
Sorted by: date

Displaying records 31 to 40 of 74 records.
Resort by: Date / Title


31. Characterization of the response of chromium-doped alumina screens in the vacuum ultraviolet using synchrotron radiation,
Published: 1/1/2002
Authors: James K McCarthy, A Baciero, B Zurro, Uwe Arp, Charles S Tarrio, Thomas B Lucatorto, A Morono, P Martin, E R Hodgson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101617

32. Influence of the Vertical Emittance on the Calculability of the Synchrotron Ultraviolet Radiation Facility
Published: 1/1/2002
Author: Uwe Arp
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101018

33. New SURF Web Site
Published: 1/1/2002
Author: Uwe Arp
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100275

34. Studies of intensity noise at SURF III
Published: 1/1/2002
Authors: Uwe Arp, Thomas B Lucatorto, K Harkay, Kyoungsik Kim
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101047

35. Synchrotron ultraviolet radiation facility SURF III
Published: 1/1/2002
Authors: Uwe Arp, Charles W Clark, Alex P. Farrell, E Fein, Mitchell L. Furst, Edward Walter Hagley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101027

36. The New Beam line 3 at SURF III for Source-Base Radiometry
Published: 1/1/2002
Authors: Ping-Shine Shaw, D A Shear, R Stamilio, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104741

37. The new beamline 3 at SURF III for source-based radiometry,
Published: 1/1/2002
Authors: Ping-Shine Shaw, D A Shear, R J Stamilio, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101713

38. Upgrades to the NIST/DARPA EUV Reflectometry Facility
Published: 12/1/2001
Authors: Charles S Tarrio, Thomas B Lucatorto, S Grantham, M B Squires, Uwe Arp, Lu Deng
Abstract: We have recently installed a new sample chamber at the NIST/DARPA EUV Reflectometry Facility at the National Institute of Standards and Technology. The chamber replaces a much smaller system on Beamline 7 at the Synchrotron Ultraviolet Radiation Fac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841579

39. Tomography of Integrated Circuit Interconnects
Published: 10/1/2001
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: 00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840113

40. Elimation of Intensity Noise at SURF III
Published: 8/1/2001
Authors: Uwe Arp, K Harkay, K Kim, Thomas B Lucatorto
Abstract: Most applications of synchrotron radiation are not very sensitive to source intensity fluctuations. Fourier-transform spectroscopy, however, is very sensitive to intensity noise with frequencies of few Hz to several kHz. An infrared spectrometer in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841535



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series