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You searched on: Author: uwe arp

Displaying records 41 to 50 of 78 records.
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41. The new beamline 3 at SURF III for source-based radiometry,
Published: 1/1/2002
Authors: Ping-Shine Shaw, D A Shear, R J Stamilio, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101713

42. Upgrades to the NIST/DARPA EUV Reflectometry Facility
Published: 12/1/2001
Authors: Charles S Tarrio, Thomas B Lucatorto, S Grantham, M B Squires, Uwe Arp, Lu Deng
Abstract: We have recently installed a new sample chamber at the NIST/DARPA EUV Reflectometry Facility at the National Institute of Standards and Technology. The chamber replaces a much smaller system on Beamline 7 at the Synchrotron Ultraviolet Radiation Fac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841579

43. Tomography of Integrated Circuit Interconnects
Published: 10/1/2001
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: 00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840113

44. Elimation of Intensity Noise at SURF III
Published: 8/1/2001
Authors: Uwe Arp, K Harkay, K Kim, Thomas B Lucatorto
Abstract: Most applications of synchrotron radiation are not very sensitive to source intensity fluctuations. Fourier-transform spectroscopy, however, is very sensitive to intensity noise with frequencies of few Hz to several kHz. An infrared spectrometer in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841535

45. Spontaneous Coherent Microwave Emission and the Sawtooth Instability in a Compact Storage Ring
Published: 5/1/2001
Authors: Uwe Arp, Gerald T Fraser, Angela R Hight Walker, Thomas B Lucatorto, K K Lehmann, K Harkay, N Sereno, K Kim
Abstract: Strong evidence for self-excited emission of coherent synchrotron radiation in the microwave spectral region was observed at the Synchrotron Ultraviolet Radiation Facility SURF III electron storage ring at the National Institute of Standards and Tech ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840285

46. Diffraction and Depths-of-Field Effects in Electron Beam Imaging at SURF III
Published: 4/1/2001
Author: Uwe Arp
Abstract: Imaging an electron beam with visible light is a common method of diagnostics applied to electron accelerators. It is a straightforward way to deduce the transverse electron distribution as well as its changes over time. The electrons stored in the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840096

47. Diffraction and depths-of-field effects in electron beam imaging at SURF III
Published: 1/1/2001
Author: Uwe Arp
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101284

48. Improvements to the NIST/DARPA EUV Reflectometry Facility
Published: 1/1/2001
Authors: Charles S Tarrio, Thomas B Lucatorto, S Grantham, M B Squires, Uwe Arp, Lu Deng
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100201

49. Spontaneous Coherent Microwave Emission and the Sawtooth Instability in a Compact Storage Ring
Published: 1/1/2001
Authors: Uwe Arp, Gerald T Fraser, Angela R Hight Walker, Thomas B Lucatorto, K K Lehmann, K Harkay, N Sereno, Kyoungsik Kim
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101023

50. Spontaneous coherent microwave emission and the sawtooth instability in a compact storage ring
Published: 1/1/2001
Authors: Uwe Arp, Gerald T Fraser, A R Hight-walker, Thomas B Lucatorto, K K Lehmann, K Harkay, N Sereno, Kyoungsik Kim
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101075



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