NIST logo

Publications Portal

You searched on:
Author: uwe arp

Displaying records 1 to 10 of 77 records.
Resort by: Date / Title


1. Absolute pulse energy measurements of soft x-rays at the Linac Coherent Light Source
Published: 8/25/2014
Authors: Uwe Arp, Alexander Sorokin, Ulf Jastrow, Pavle Jurani?, Svea Kreis, Mathias Richter, Yiping Feng, Dennis Nordlund, Kai Tiedtke, Philip Heimann, Bob Nagler, Hae Ja Lee, Stephanie Mack, Marco Cammarata, Oleg Krupin, Marc Messerschmidt, Michael Holmes , Michael Rowen, William Schlotter, Stefan Moeller, Joshua Turner
Abstract: This paper reports novel measurements of x-ray optical radiation on an absolute scale from a recently developed source of radiation generated in the soft x-ray regime of a free electron laser. We give a brief description of the physics behind the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916074

2. Argon mini-arc mets its match: use of a laser-driven plasma source in ultraviolet-detector calibrations
Published: 2/13/2014
Authors: Uwe Arp, Robert Edward Vest, Jeanne M Houston, Thomas B Lucatorto
Abstract: The National Institute of Standards and Technology operates two Spectral Comparator Facilities, which are used to provide detector calibrations from the ultraviolet to the near-infrared spectral range. One of them, the Ultraviolet Spectral Compar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914845

3. First Report on Quantum Dot Coated CMOS CID Arrays for the UV and VUV
Published: 12/13/2013
Authors: Uwe Arp, Robert Edward Vest, Zoran Ninkov, Ross Robinson, Suraj Bhaskaran
Abstract: A technique has been developed for coating commercial off the shelf (COTS) detector arrays with a thin, uniform layer of quantum dots. The quantum deposition is accomplished using an Optomec Aerosol Jet rapid prototyping system. When illuminated by U ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914748

4. Response of large area avalanche photodiodes to low energy X-rays
Published: 4/30/2012
Authors: Thomas R. Gentile, Uwe Arp, M J Bales, R Farrell
Abstract: For an experiment to study neutron radiative beta-decay, we operated large area avalanche photodiodes (APDs) at liquid nitrogen temperature to detect X-rays with energies between 0.2 keV and 15 keV. Whereas there are numerous reports of X-ray spect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910652

5. SURF III: A flexible Synchrotron Radiation Source for Radiometry and Research
Published: 9/1/2011
Authors: Uwe Arp, Charles W Clark, Lu Deng, Nadir S. Faradzhev, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Shannon Bradley Hill, Thomas B Lucatorto, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
Abstract: The calculability of synchrotron radiation (SR) makes electron storage rings wonderful light sources for radiometry. The broadband nature of SR allows coverage of the whole spectral region from the x-ray to the far-infrared. Compact low-energy storag ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906750

6. Metrologia
Published: 7/8/2011
Authors: Uwe Arp, Zhigang Li, Ping-Shine Shaw, Mathias Richter, Roman Klein, Wolfgang Paustian, Reiner Thornagel
Abstract: We report on a successful bilateral inter-comparison between the Physikalisch-Technische Bundesanstalt (PTB) and the National Institute of Standards and Technology (NIST). In both laboratories deuterium lamps were calibrated using the calculability o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907243

7. Bilateral NIST-PTB Comparison of Spectral Responsivity in the VUV
Published: 1/20/2011
Authors: Uwe Arp, Ping-Shine Shaw, Zhigang Li, Alexander Gottwald, Mathias Richter
Abstract: To compare the calibration capabilities for the spectral responsivity in the vacuum-ultraviolet spectral region between 135 nm and 250 nm, PTB and NIST agreed on a bilateral comparison. Calibrations of semiconductor photodiodes as transfer detectors ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905153

8. Long-Term Monitoring of the Ultraviolet Irradiance Scale at the Facility for Irradiance Calibration Using Synchrotrons
Published: 6/18/2010
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Charles E Gibson, Howard W Yoon, Keith R Lykke
Abstract: In 2004, the National Institute of Standards and Technology (NIST) established the ultraviolet (UV) spectral irradiance scale from 200 nm to 400 nm using the calculable irradiance of the Synchrotron Ultraviolet Radiation Facility (SURF). Since the es ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904737

9. Measurement of the ultraviolet-induced fluorescence yield from integrating spheres
Published: 6/2/2009
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
Abstract: We report theory and measurements of a simple and absolute technique for the determination of the total emitted spectral fluorescence yield inside an integrating sphere from the sphere coating under irradiation with a monochromatic beam. This techniq ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842602

10. Uniform and enhanced field emission from chromium oxide coated carbon nanosheets
Published: 4/2/2008
Authors: Uwe Arp, Kun Hou, Ronald Outlaw, Wang Sigen, Mingyao Zhu, Ronald Quinlan, Dennis Manos, Martin Kordesch, Brian Holloway
Abstract: Carbon nanosheets, a two-dimensional carbon nanostructure, are promising electron cathode materials for applications in vacuum microelectronic devices. This letter demonstrates a simple approach to improve the spatial emission uniformity of carbon na ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903061



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series