NIST logo

Publications Portal

You searched on:
Author: xiaoyu zheng
Sorted by: title

Displaying records 1 to 10 of 25 records.
Resort by: Date / Title


1. An Iterative Algorithm for Calculating Stylus Radius Unambiguously
Published: 9/24/2011
Authors: Theodore Vincent Vorburger, Xiaoyu A Zheng, Thomas B Renegar, Jun-Feng Song, Li Ma
Abstract: The stylus radius is an important specification for stylus instruments and is commonly provided by instrument manufacturers. However, it is difficult to measure the stylus radius unambiguously. Accurate profiles of the stylus tip may be obtained by ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907724

2. Applications of Cross-Correlation Functions
Published: 4/14/2010
Authors: Theodore Vincent Vorburger, Jun-Feng Song, Wei Chu, Li Ma, Xiaoyu A Zheng, Thomas B Renegar, Son H Bui
Abstract: We describe several examples where we use cross-correlation functions to quantify the similarity of 2D surface profiles or of 3D surface topography images. The applications have included 1) the manufacture of Standard Reference Material (SRM) bullet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902481

3. Applications of Profile Filtering in the Dimensional Metrology of Fuel Cell Plates
Published: 5/14/2013
Authors: Balasubramanian Muralikrishnan, Wei Ren, Eric S Stanfield, Dennis S Everett, Xiaoyu A Zheng, Theodore D Doiron
Abstract: We describe the application of several surface profile filters as an enabling tool in the dimensional measurements of an engineering artifact, namely, a fuel cell plate. We recently reported work on the development of a non-contact system for dimensi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913301

4. Applications of Surface Metrology in Firearm Identification
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. Toolmarks are created when a tool comes into contact with a surface an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914401

5. Applications of Surface Metrology in Toolmark Identification
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. In 2009, a report by the National Academies called into question, amon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913337

6. Comparison of Optical and Stylus Methods for Measurement of Rough Surfaces
Published: 1/1/2007
Authors: Theodore Vincent Vorburger, H G Rhee, Thomas B Renegar, Jun-Feng Song, Xiaoyu A Zheng
Abstract: Abstract Optical methods are increasingly used for measurement of surface texture, particularly for areal measurements where the optical methods are generally faster. A new Working Group under Technical Committee (TC) 213 in the International Organiz ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824605

7. Confocal Microscopy Analysis of Breech Face Marks on Fired Cartridge Cases from Ten Consecutively Manufactured Pistol Slides
Published: 7/1/2012
Authors: Xiaoyu A Zheng, Robert Meryln Thompson, Todd Weller
Abstract: Ten (10) pistol slides with consecutively manufactured breech faces, were obtained from Sturm, Ruger Co, Inc. A total of nine (9) test fires from each pistol, for a total of ninety (90) test fired cartridge cases, were compared using comparison micr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906690

8. Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques
Published: 1/1/2006
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Thomas B Renegar, Xiaoyu A Zheng, Hyug-Gyo Rhee, John M Libert, Li Ma, K Bogart, Susan M Ballou, B Bachrach
Abstract: Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the measurements of bullet profile signatures of a National Institute of Standards and Technolo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822359

9. Development of Ballistics Identification ‹ From Image Comparison to Topography Measurement in Surface Metrology-
Published: 3/22/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Thomas B Renegar, Xiaoyu A Zheng, James H Yen, Richard M Silver, Wei Chu
Abstract: Fired bullets and ejected cartridge cases have unique ballistics signatures left by the firearm. By analyzing the ballistics signatures, forensic examiners can trace these bullets and cartridge cases to the firearm used in a crime scene. Current au ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908043

10. GEOMETRIC MEASUREMENT COMPARISONS FOR ROCKWELL DIAMOND INDENTERS
Published: 9/6/2009
Authors: Jun-Feng Song, Samuel Rea Low III, Xiaoyu A Zheng
Abstract: In the uncertainty budget of Rockwell C hardness (HRC) tests, geometric error of the Rockwell diamond indenter is a major contributor. The geometric calibration of Rockwell diamond indenters has been a key issue for Rockwell hardness standardization ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902704



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series