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You searched on: Author: nien zhang

Displaying records 31 to 40 of 70 records.
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31. Development of a Serum-Based Standard Reference Material with Certified Values for Homocysteine and Folate
Published: 11/1/2005
Authors: Lorna Tregoning Sniegoski, Bryant C Nelson, Mary B Satterfield, Nien F Zhang, Adriana Hornikova, Michael James Welch, Christine M Pfeiffer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904492

32. An Application of Combining Results from Multiple Methods|Statistical Evaluation of Uncertainty for NIST SRM 1508a
Published: 10/1/2005
Authors: Adriana Hornikova, Nien F Zhang, Michael James Welch, Susan Shu Cheng Tai
Abstract: NIST Standard Reference Materials (SRM) are certified reference materials that are developed at NIST and provided to laboratories (industry, government and academia) for assessment and improvement of measurement quality. SRM 1508a, is re-certified t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50367

33. The Effect of Uncertainty Components Such as Recalibration on the Performance of Quality Control Charts
Published: 5/2/2005
Authors: P Winkel, Nien F Zhang
Abstract: Daily QC measurements of biochemical quantities were recorded during 4 to 5 months while methods and analyser showed no signs of malfunctioning. The time series of QC values were divided into subseries according to reagents or electrolyte diluent lo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151796

34. Statistical Analysis of Key Comparisons with Linear Trends
Published: 8/1/2004
Authors: Nien F Zhang, Hung-Kung Liu, N Sedransk, W Strawderman
Abstract: A statistical analysis for Key Comparisons with linear trend is proposed. The approach has the advantage that it is consistent with the case in which there is no trend. The uncertainties for KCRV and the degrees of equivalence are also provided. As ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50565

35. CCEM-K5 Comparison of 50/60 Hz Power
Published: 7/1/2004
Authors: Nile M. Oldham, Thomas L Nelson, Nien F Zhang, H Liu
Abstract: Electrical standards of low-frequency (50/60 Hz) power at 15 National Metrology Institutes (NMI) were compared to establish the relationship between the electrical units at these laboratories. The results of this comparison are described. The differe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30859

36. Serial Correlation of Quality Control Data -- On the Use of Proper Control Charts
Published: 6/1/2004
Authors: P Winkel, Nien F Zhang
Abstract: Biochemical quality control data have been reported to be autocorrelated. Serial correlation may increase the rate of false alarms and decrease that of true alarms if traditional control charts are used. In this paper, the times series were examine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151786

37. Statistical Process Control in Biochemical and Hematological Quality Control Data
Published: 5/3/2004
Authors: Nien F Zhang, P Winkel
Abstract: Daily quality control (QC) measurements of common biochemical and hematological quantities were recorded during several months while methods and analyzers showed no signs of malfunctioning.Usually it is assumed that QC data may be described as i.i.d. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151799

38. Serial Correlation of QC Data on the Use of Proper Control Charts
Published: 5/1/2004
Authors: P Winkel, Nien F Zhang
Abstract: Biochemical quality control data have been reported to be autocorrelated. Serial correlation may increase the rate of false alarms and decrease that of true alarms if traditional control charts are used. In this paper, the times series were examin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50809

39. A Kurtosis-Based Statistical Measure for Two-Dimensional Processes and Its Applications to Image Sharpness
Published: 6/30/2003
Authors: Nien F Zhang, Andras Vladar, Michael T Postek, Robert D. Larrabee
Abstract: Fully automated or semiautomatic scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. It is required that these automated instruments be routinely capable of 3 nanometer (nm) or bett ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50812

40. Performance Evaluation of Approaches to Combining Results From Multiple Methods
Published: 4/1/2003
Authors: Hung-Kung Liu, Nien F Zhang
Abstract: The problem of determining a consensus mean and its uncertainty from the results of multiple measurement methods or laboratories is an important problem. Many solutions, both Bayesian and non-Bayesian, to this problem have been proposed over the ye ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50804



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