NIST logo

Publications Portal

You searched on: Author: howard yoon

Displaying records 31 to 40 of 125 records.
Resort by: Date / Title


31. Short-wave infrared radiometers design and characterization
Published: 4/1/2007
Authors: George P Eppeldauer, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104429

32. The use of thermo-electric cooled short-wave infrared detectors in heat-seeking systems
Published: 2/14/2007
Authors: Howard W Yoon, George P Eppeldauer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104808

33. Once is Enough in Radiometric Calibrations
Series: Journal of Research (NIST JRES)
Published: 2/1/2007
Authors: Gerald T Fraser, Charles E Gibson, Howard W Yoon, Albert C Parr
Abstract: The successful development of an Optical Technology Division quality system for optical radiation measurement services has provided the opportunity to reconsider the existing calibration procedures to improve quality and reduce costs. We have institu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841160

34. The use of thermo-electric cooled short-wave infrared detectors in heat-seeking systems
Published: 2/1/2007
Author: Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101796

35. Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III
Published: 1/1/2007
Authors: Uwe Arp, Charles E Gibson, Keith R Lykke, Albert C Parr, Robert D. Saunders, D J Shin, Ping-Shine Shaw, Zhigang Li, Howard W Yoon
Abstract: A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841022

36. Flow visualization of heated CO2 gas using thermal imaging
Published: 1/1/2006
Authors: Joseph Paul Rice, Howard W Yoon, M H Brenner, N R Briggs, J G Gillen
Abstract: Walk-through portal detection systems are being developed to screen passengers for the presence of explosives in support of homeland security. These portals utilize a series of air-jets to remove the explosive particles for detection using ion mo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104135

37. Performance comparisons of InGaAs, extended InGaAs and short-wave HgCdTe detectors between 1 {mu}m and 2.5 {mu}m
Published: 1/1/2006
Authors: Howard W Yoon, M C Eppeldauer Dopkiss
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104268

38. The NIST eutectic project: construction of Co-C, Pt-C, and Re-c fixed point cells and their comparison with the NMIJ
Published: 1/1/2006
Authors: Charles E Gibson, Vladimir Kromchenko, N Sakuma Sasajima, Yohsiro Yamada, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103812

39. Methods to Reduce the Size-of-Source Effect in Radiation Thermometers
Published: 4/1/2005
Authors: Howard W Yoon, David W Allen, Robert D. Saunders
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841848

40. Simultaneous Visible and Thermal Imaging of Metals During Machining
Published: 3/28/2005
Authors: Eric Paul Whitenton, Robert W Ivester, Howard W Yoon
Abstract: In order to investigate temperatures reached during orthogonal metal cutting, a novel approach for measuring temperatures at the tool-chip interface has been developed based on high-speed thermography. A thermal infrared camera and a visible camera ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822233



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series