NIST logo

Publications Portal

You searched on:
Author: john woodward iv

Displaying records 31 to 40 of 43 records.
Resort by: Date / Title


31. First-Principles Determination of Hybrid Bilayer Membrane Structure by Phase-Sensitive Neutron Reflectometry
Published: 12/1/2000
Authors: Charles F Majkrzak, Norman Frederic Berk, S. Krueger, Joseph A Dura, M. Tarek, D Tobias, Vitalii Ivanovich Silin, Curtis W Meuse, John Taylor Woodward IV, Anne L Plant
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903591

32. Atomic force microscope imaging of molecular aggregation during self-assembled monolayer growth
Published: 11/1/2000
Authors: I. Doudevski, W. A. Hayes, John Taylor Woodward IV, D. K. Schwartz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903984

33. The Effect of an Oxidized Gold Substrate on Alkanethiol Self-Assembly
Published: 6/1/2000
Authors: John Taylor Woodward IV, Marlon L Walker, Curtis W Meuse, David J Vanderah, G Poirier, Anne L Plant
Abstract: UV cleaned gold substrates incubated in solutions of alkanethiol show islands on the monolayer surface when imaged with non-contact atomic force microscopy (AFM). The height of the islands above the monolayer is approximately twice the height of th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830103

34. Atomic Force Microscopy of Hybrid Bilayer Membranes
Published: 2/1/2000
Author: John Taylor Woodward IV
Abstract: Hybrid bilayer membranes (HBM) are synthetic membrane mimics designed to form a biomimetic surface. The basic HBM system consists of a lipid monolayer adsorbed to an alkanethiol self-assembled monolayer. More advanced versionshave used different thio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830155

35. Removing Drift From Scanning Probe Microscope Images of Periodic Samples
Published: 2/10/1998
Authors: John Taylor Woodward IV, D. K. Schwartz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901660

36. Direct Evidence for an Ion-By-Ion Deposition Mechanism in Solution Growth of CdS Thin Films
Published: 2/5/1998
Authors: M. L. Breen, John Taylor Woodward IV, D. K. Schwartz, A. W. Apblett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901591

37. Dewetting Modes of Surfactant Solution as a Function of the Spreading Coefficient
Published: 2/10/1997
Authors: John Taylor Woodward IV, D. K. Schwartz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901661

38. Chemical Force Microscopy for Imaging Chemical Distributions in Undeveloped Resists
Published: Date unknown
Authors: John Taylor Woodward IV, Jeeseong Hwang, Bryan D. Vogt, Vivek M Prabhu, Eric K Lin, Kwang-Woo Choi, Harun Solak, Michael Leeson
Abstract: Controlling line width roughness (LWR) is a critical problem in the development of EUV resists. Contributing to the difficulty of reducing LWR is the limited knowledge of the nanoscale morphology of the resist film throughout the process. Generally ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841144

39. Chemical Force Microscopy of 30 nm Half-Pitch Latent Images in Poly(Methyl-Methacrylate)
Published: Date unknown
Authors: John Taylor Woodward IV, Harun Solak
Abstract: Poly(methyl-methacrylate) (PMMA) thin films were spun cast on silicon and exposed to a 30 nm half-pitch EUV interference pattern. The sample was imaged by chemical force microscope (CFM) using a methyl functionalized AFM tip in lateral force mode. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841049

40. Molecular-scale Structural and Functional Characterization of Sparsely Tethered Bilayer Membranes
Published: Date unknown
Authors: Duncan McGillivray, Gintaras Valincius, David J Vanderah, W Febo-Ayala, John Taylor Woodward IV, F Hienrich, John J Kasianowicz, M Losche
Abstract: Surface-tethered biomimetic bilayer membranes (tethered lipid bilayer membranes, tBLMs) have been formed on gold surfaces from phospholipids and a synthetic 1-thiahexa(ethy lene oxide) lipid, WC14. They have been characterized using electrochemical i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830536



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series